Shinichiro HAYASHI

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Miyagi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analysis method
- Patent number 8,514,403
- Issue date Aug 20, 2013
- TOHOKU UNIVERSITY
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 8,492,718
- Issue date Jul 23, 2013
- Advantest Corporation
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave measuring apparatus having space arrangement structu...
- Patent number 8,253,103
- Issue date Aug 28, 2012
- Advantest Corporation
- Yuichi Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20120235043
- Publication date Sep 20, 2012
- Advantest Corporation
- Yuichi OGAWA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS METHOD
- Publication number 20110205528
- Publication date Aug 25, 2011
- Tohoku University
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20100025586
- Publication date Feb 4, 2010
- Advantest Corporation
- Yuichi OGAWA
- G01 - MEASURING TESTING