Shinichiro Iwatani

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Hiroshima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Texture indication measuring method and measuring devices
- Patent number 9,594,069
- Issue date Mar 14, 2017
- Hiroshima University
- Naoki Sakurai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEXTURE INDICATION MEASURING METHOD AND MEASURING DEVICES
- Publication number 20130228016
- Publication date Sep 5, 2013
- HIROSHIMA UNIVERSITY
- Naoki Sakurai
- G01 - MEASURING TESTING