Shinichiro Mori

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Kusatsu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semi-conductor chip test probe and process for manufacturing the probe
- Patent number 5,723,347
- Issue date Mar 3, 1998
- International Business Machines Corp.
- Toshiki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Semi-conductor chip test probe
- Patent number 5,625,298
- Issue date Apr 29, 1997
- International Business Machines Corp.
- Toshiki Hirano
- G01 - MEASURING TESTING