Shinichiro Takase

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card having a structure for being prevented from deforming
- Patent number 8,415,964
- Issue date Apr 9, 2013
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe device having a structure for being prevented from deforming
- Patent number 8,319,511
- Issue date Nov 27, 2012
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Contact structure for inspection
- Patent number 8,310,257
- Issue date Nov 13, 2012
- Tokyo Electron Limited
- Shinichiro Takase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT STRUCTURE FOR INSPECTION
- Publication number 20110043232
- Publication date Feb 24, 2011
- TOKYO ELECTRON LIMITED
- Shinichiro TAKASE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PROBE SUPPORTING PLATE, COMPUTER STORAGE M...
- Publication number 20110006799
- Publication date Jan 13, 2011
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE
- Publication number 20100301888
- Publication date Dec 2, 2010
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20100301887
- Publication date Dec 2, 2010
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING