Shinichiro Takasu

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring a substitutional carbon concentration
- Patent number 5,808,745
- Issue date Sep 15, 1998
- Toshiba Ceramics Co., Ltd.
- Hiroshi Shirai
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for measuring interstitial oxygen concentration
- Patent number 5,287,167
- Issue date Feb 15, 1994
- Toshiba Ceramics Co., Ltd.
- Hiroshi Shirai
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating three-dimensional semiconductor devices utili...
- Patent number 4,479,297
- Issue date Oct 30, 1984
- Tokyo Shibaura Denki Kabushiki Kaisha
- Yoshihisa Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for transferring a fine pattern onto a target
- Patent number 4,411,013
- Issue date Oct 18, 1983
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shinichiro Takasu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing a single crystal silicon rod
- Patent number 4,378,269
- Issue date Mar 29, 1983
- Vlsi Technology Research Association
- Yoshiaki Matsushita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Apparatus for measuring the distribution of irregularities on a mir...
- Patent number 4,291,990
- Issue date Sep 29, 1981
- Vlsi Technology Research Association
- Shinichiro Takasu
- G01 - MEASURING TESTING