Shinichiro YANAKA

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Ibaraki-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,448
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,447
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Laser tracking interferometer
- Patent number 9,316,487
- Issue date Apr 19, 2016
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS
- Publication number 20190187660
- Publication date Jun 20, 2019
- MITUTOYO CORPORATION
- Shinichiro YANAKA
- G05 - CONTROLLING REGULATING
Information Patent Application
SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS
- Publication number 20190187661
- Publication date Jun 20, 2019
- MITUTOYO CORPORATION
- Shinichiro YANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER TRACKING INTERFEROMETER
- Publication number 20140347673
- Publication date Nov 27, 2014
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING