Shinji AIZAWA

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interference electron microscope
- Patent number 8,785,851
- Issue date Jul 22, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device including a first electron biprism to split an...
- Patent number 8,772,715
- Issue date Jul 8, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTERFERENCE ELECTRON MICROSCOPE
- Publication number 20130313432
- Publication date Nov 28, 2013
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20130284925
- Publication date Oct 31, 2013
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS