Shinji Akima

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Asaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Photomask defect testing method, photomask manufacturing method and...
- Patent number 7,037,627
- Issue date May 2, 2006
- Sharp Kabushiki Kaisha
- Eiji Aoki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Photomask defect testing method, photomask manufacturing method and...
- Publication number 20040086791
- Publication date May 6, 2004
- Sharp Kabushiki Kaisha
- Eiji Aoki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY