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Shinji AZUMA

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,662,358
    • Issue date May 30, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and automatic analysis method
    • Patent number 11,353,473
    • Issue date Jun 7, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takumi Ito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and automatic analysis method
    • Patent number 11,262,371
    • Issue date Mar 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masashi Fukaya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,162,965
    • Issue date Nov 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Shinji Azuma
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Specimen transport device, specimen pretreatment system, analysis s...
    • Patent number 9,884,725
    • Issue date Feb 6, 2018
    • Hitachi High-Technologies Corporation
    • Shugo Okabe
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Transport line cover
    • Patent number 9,709,585
    • Issue date Jul 18, 2017
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Sample transporting apparatus
    • Patent number D750271
    • Issue date Feb 23, 2016
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automatic analyzer including pressure sensor for washing solution
    • Patent number 9,176,156
    • Issue date Nov 3, 2015
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Cover stopper for a sample transporting apparatus
    • Patent number D735349
    • Issue date Jul 28, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cover for a sample transporting apparatus
    • Patent number D734864
    • Issue date Jul 21, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cover stopper for a sample transporting apparatus
    • Patent number D734485
    • Issue date Jul 14, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cover for a sample transporting apparatus
    • Patent number D734486
    • Issue date Jul 14, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Leg for a sample transporting apparatus
    • Patent number D733904
    • Issue date Jul 7, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample transporting apparatus
    • Patent number D733906
    • Issue date Jul 7, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample transporting apparatus
    • Patent number D733905
    • Issue date Jul 7, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample transporting apparatus
    • Patent number D733907
    • Issue date Jul 7, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,052,301
    • Issue date Jun 9, 2015
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Specimen Transportation Device
    • Publication number 20240094234
    • Publication date Mar 21, 2024
    • Hitachi High-Tech Corporation
    • Hiroyuki KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample Conveyance System and Sample Conveyance Method
    • Publication number 20240067467
    • Publication date Feb 29, 2024
    • Hitachi High-Tech Corporation
    • Takeshi TAMAKOSHI
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    SPECIMEN INSPECTION SYSTEM, AND CONVEYANCE METHOD
    • Publication number 20240036068
    • Publication date Feb 1, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Shigeru YANO
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    CONVEYANCE DEVICE
    • Publication number 20230365354
    • Publication date Nov 16, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Ryosuke HOSHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SPECIMEN CONTAINER CARRIER AND SPECIMEN TRANSPORT DEVICE
    • Publication number 20230366899
    • Publication date Nov 16, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shinji AZUMA
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230251280
    • Publication date Aug 10, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shinji AZUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220018869
    • Publication date Jan 20, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shinji AZUMA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20200378997
    • Publication date Dec 3, 2020
    • Shinji AZUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer and Automatic Analysis Method
    • Publication number 20200072856
    • Publication date Mar 5, 2020
    • Hitachi High-Technologies Corporation
    • Masashi FUKAYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer and Automatic Analysis Method
    • Publication number 20200064364
    • Publication date Feb 27, 2020
    • Hitachi High-Technologies Corporation
    • Takumi ITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TRANSPORT APPARATUS
    • Publication number 20180038881
    • Publication date Feb 8, 2018
    • Hitachi High-Technologies Corporation
    • Mitsuru OONUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECIMEN TRANSPORT DEVICE, SPECIMEN PRETREATMENT SYSTEM, ANALYSIS S...
    • Publication number 20160251164
    • Publication date Sep 1, 2016
    • Shugo OKABE
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    TRANSPORT LINE COVER
    • Publication number 20150175316
    • Publication date Jun 25, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru OONUMA
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    SAMPLE TRANSPORT APPARATUS
    • Publication number 20150177267
    • Publication date Jun 25, 2015
    • Hitachi High-Technologies Corporation
    • Mitsuru OONUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130115134
    • Publication date May 9, 2013
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110174343
    • Publication date Jul 21, 2011
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090220383
    • Publication date Sep 3, 2009
    • Masahiko IIJIMA
    • G01 - MEASURING TESTING