Shinji Enoshima

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Itami, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of testing semiconductor device and test apparatus for the same
- Patent number 5,578,919
- Issue date Nov 26, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING
Information Patent Grant
Tape carrier, and test apparatus for the same
- Patent number 5,517,036
- Issue date May 14, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING