Shinji Fujikake

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Nagano, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,790,519
- Issue date Sep 7, 2010
- Fuji Electric Systems Co., Ltd.
- Setsuko Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating film thickness, method of detecting polishing...
- Patent number 7,446,889
- Issue date Nov 4, 2008
- Fuji Electric Holdings Co., Ltd.
- Shinji Fujikake
- B24 - GRINDING POLISHING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,262,100
- Issue date Aug 28, 2007
- Fuji Electric Holdings Co., Ltd.
- Setsuko Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20070262362
- Publication date Nov 15, 2007
- Fuji Electric Holdings Co., Ltd.
- Setsuko Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20070224769
- Publication date Sep 27, 2007
- Fuji Electric Holdings Co., Ltd.
- Setsuko Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20060076583
- Publication date Apr 13, 2006
- Fuji Electric Holdings Co., Ltd.
- Setsuko Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of evaluating film thickness, method of detecting polishing...
- Publication number 20050191859
- Publication date Sep 1, 2005
- FUJI ELECTRIC HOLDING CO., LTD.
- Shinji Fujikake
- B24 - GRINDING POLISHING