Shinji Iino

Person

Sumiyoshi-cho, Fuchu Tokyo 183, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contactor and production method for contactor
- Patent number RE41515
- Issue date Aug 17, 2010
- Tokyo Electron Limited
- Junichi Hagihara
- 324 - Electricity: measuring and testing
Information Patent Grant
Inspection apparatus to break the oxide of an electrode by fritting...
- Patent number 7,319,339
- Issue date Jan 15, 2008
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 7,304,489
- Issue date Dec 4, 2007
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 7,061,259
- Issue date Jun 13, 2006
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Probing method
- Patent number 6,850,052
- Issue date Feb 1, 2005
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 6,777,967
- Issue date Aug 17, 2004
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Contractor, method for manufacturing the same, and probe card using...
- Patent number 6,747,465
- Issue date Jun 8, 2004
- Tokyo Electron Limited
- Masayoshi Esashi
- G01 - MEASURING TESTING
Information Patent Grant
Assembly apparatus and method of contactor
- Patent number 6,747,467
- Issue date Jun 8, 2004
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Drivingly rotatable mechanism of specimen loading table and specime...
- Patent number 6,634,245
- Issue date Oct 21, 2003
- Tokyo Electron Limited
- Haruhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Contactor holding mechanism and automatic change mechanism for cont...
- Patent number 6,590,381
- Issue date Jul 8, 2003
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
High-speed probing apparatus
- Patent number 6,545,493
- Issue date Apr 8, 2003
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Screening method of semiconductor device and apparatus thereof
- Patent number 6,380,753
- Issue date Apr 30, 2002
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Contactor and production method for contractor
- Patent number 6,344,752
- Issue date Feb 5, 2002
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe method
- Patent number 6,140,828
- Issue date Oct 31, 2000
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus for semiconductor integrated circui...
- Patent number 6,130,543
- Issue date Oct 10, 2000
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device for inspecting a semiconductor wafer
- Patent number 6,075,373
- Issue date Jun 13, 2000
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Conductor pattern check apparatus for locating and repairing short...
- Patent number 5,844,199
- Issue date Dec 1, 1998
- Shinji Iino
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Unit for transferring to-be-inspected object to inspection position
- Patent number 5,825,500
- Issue date Oct 20, 1998
- Tokyo Electron Limited
- Shinji Iino
- G02 - OPTICS
Information Patent Grant
Method and apparatus for probe testing substrate
- Patent number 5,742,173
- Issue date Apr 21, 1998
- Tokyo Electron Limited
- Yoichi Nakagomi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for examining target objects such as LCD panels
- Patent number 5,691,764
- Issue date Nov 25, 1997
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Conductor pattern check apparatus for locating and repairing open c...
- Patent number 5,639,390
- Issue date Jun 17, 1997
- Tokyo Electron Limited
- Shinji Iino
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe apparatus having burn-in test function
- Patent number 5,568,054
- Issue date Oct 22, 1996
- Tokyo Electron Limited
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 5,412,329
- Issue date May 2, 1995
- Tokyo Electron Yamanashi Limited
- Shinji Iino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20070229101
- Publication date Oct 4, 2007
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20060192578
- Publication date Aug 31, 2006
- TOKYO ELECTON LIMITED
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20040174177
- Publication date Sep 9, 2004
- TOKYO ELECTRON LIMITED
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Contactor, method for manufacturing the same, and probe card using...
- Publication number 20020057099
- Publication date May 16, 2002
- Masayoshi Esashi
- G01 - MEASURING TESTING
Information Patent Application
Assembly apparatus and method of contactor
- Publication number 20020053922
- Publication date May 9, 2002
- Shinji Iino
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20020021142
- Publication date Feb 21, 2002
- Shinji Iino
- G01 - MEASURING TESTING

Shinji Iino

Person

Patents Grantslast 30 patents

Contactor and production method for contactor

Inspection apparatus to break the oxide of an electrode by fritting...

Inspection method and inspection apparatus

Inspection method and inspection apparatus

Probing method

Inspection method and inspection apparatus

Contractor, method for manufacturing the same, and probe card using...

Assembly apparatus and method of contactor

Drivingly rotatable mechanism of specimen loading table and specime...

Contactor holding mechanism and automatic change mechanism for cont...

High-speed probing apparatus

Screening method of semiconductor device and apparatus thereof

Contactor and production method for contractor

Prober and probe method

Inspection method and apparatus for semiconductor integrated circui...

Inspection device for inspecting a semiconductor wafer

Conductor pattern check apparatus for locating and repairing short...

Unit for transferring to-be-inspected object to inspection position

Method and apparatus for probe testing substrate

Apparatus for examining target objects such as LCD panels

Conductor pattern check apparatus for locating and repairing open c...

Probe apparatus having burn-in test function

Probe card

Patents Applicationslast 30 patents

INSPECTION METHOD AND INSPECTION APPARATUS

Inspection method and inspection apparatus

Inspection method and inspection apparatus

Contactor, method for manufacturing the same, and probe card using...

Assembly apparatus and method of contactor

Inspection method and inspection apparatus