Shinji KANAZAWA

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzer configured to display list of target components
- Patent number 12,072,323
- Issue date Aug 27, 2024
- Shimadzu Corporation
- Yohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Document search support device
- Patent number 11,880,374
- Issue date Jan 23, 2024
- Shimadzu Corporation
- Shinji Kanazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Peak detection method and data processing device
- Patent number 11,499,950
- Issue date Nov 15, 2022
- Shimadzu Corporation
- Shinji Kanazawa
- G01 - MEASURING TESTING
Information Patent Grant
Waveform analyzer
- Patent number 11,486,866
- Issue date Nov 1, 2022
- Shimadzu Corporation
- Takeshi Osoekawa
- G01 - MEASURING TESTING
Information Patent Grant
Peak detection method and data processing device
- Patent number 11,327,058
- Issue date May 10, 2022
- Shimadzu Corporation
- Shinji Kanazawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for processing data
- Patent number 11,321,425
- Issue date May 3, 2022
- Shimadzu Corporation
- Shinji Kanazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform analyzer
- Patent number 11,302,039
- Issue date Apr 12, 2022
- Shimadzu Corporation
- Takeshi Osoekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling apparatus
- Patent number 10,416,136
- Issue date Sep 17, 2019
- Shimadzu Corporation
- Shinji Kanazawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE, AND ANALYZING...
- Publication number 20240345046
- Publication date Oct 17, 2024
- Shimadzu Corporation
- Hitomi YOSHIYAMA-KITAJIMA
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE AND ANALYZING...
- Publication number 20240345047
- Publication date Oct 17, 2024
- Shimadzu Corporation
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
Training Method
- Publication number 20230296572
- Publication date Sep 21, 2023
- Shimadzu Corporation
- Kenta CHINOMI
- G01 - MEASURING TESTING
Information Patent Application
LEARNING DATA PRODUCING METHOD, WAVEFORM ANALYSIS DEVICE, WAVEFORM...
- Publication number 20230280316
- Publication date Sep 7, 2023
- Shimadzu Corporation
- Shinji KANAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA GENERATION METHOD AND DEVICE, AND DISCRIMINATOR GENERATION MET...
- Publication number 20230280317
- Publication date Sep 7, 2023
- Shimadzu Corporation
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
LEARNING DATA PRODUCING METHOD, WAVEFORM ANALYSIS DEVICE, WAVEFORM...
- Publication number 20230280318
- Publication date Sep 7, 2023
- Shimadzu Corporation
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
Training Support Method
- Publication number 20230267312
- Publication date Aug 24, 2023
- Shimadzu Corporation
- Kenta CHINOMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20230243789
- Publication date Aug 3, 2023
- Shimadzu Corporation
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
Document Search Support Device
- Publication number 20220382767
- Publication date Dec 1, 2022
- Shimadzu Corporation
- Shinji KANAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform Analytical Method and Waveform Analytical Device
- Publication number 20220373522
- Publication date Nov 24, 2022
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL DEVICE AND ANALYTICAL METHOD
- Publication number 20220221434
- Publication date Jul 14, 2022
- Osaka University
- Fumio MATSUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZER
- Publication number 20220196615
- Publication date Jun 23, 2022
- SHIMADZU CORPORATION
- Yohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING DISCRIMINATOR
- Publication number 20220128532
- Publication date Apr 28, 2022
- Shimadzu Corporation
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
- Publication number 20200378933
- Publication date Dec 3, 2020
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM ANALYZER
- Publication number 20200292509
- Publication date Sep 17, 2020
- SHIMADZU CORPORATION
- Takeshi OSOEKAWA
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM ANALYZER
- Publication number 20200279408
- Publication date Sep 3, 2020
- SHIMADZU CORPORATION
- Takeshi OSOEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA
- Publication number 20190129917
- Publication date May 2, 2019
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
- Publication number 20190113486
- Publication date Apr 18, 2019
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
- Publication number 20190064130
- Publication date Feb 28, 2019
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING APPARATUS
- Publication number 20170146500
- Publication date May 25, 2017
- SHIMADZU CORPORATION
- Shinji KANAZAWA
- G01 - MEASURING TESTING

Shinji KANAZAWA

Person

Patents Grantslast 30 patents

Analyzer configured to display list of target components

Document search support device

Peak detection method and data processing device

Waveform analyzer

Peak detection method and data processing device

Method and device for processing data

Waveform analyzer

Controlling apparatus

Patents Applicationslast 30 patents

WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE, AND ANALYZING...

WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE AND ANALYZING...

Training Method

LEARNING DATA PRODUCING METHOD, WAVEFORM ANALYSIS DEVICE, WAVEFORM...

DATA GENERATION METHOD AND DEVICE, AND DISCRIMINATOR GENERATION MET...

LEARNING DATA PRODUCING METHOD, WAVEFORM ANALYSIS DEVICE, WAVEFORM...

Training Support Method

ANALYSIS DEVICE AND ANALYSIS METHOD

Document Search Support Device

Waveform Analytical Method and Waveform Analytical Device

ANALYTICAL DEVICE AND ANALYTICAL METHOD

ANALYZER

METHOD FOR CREATING DISCRIMINATOR

PEAK DETECTION METHOD AND DATA PROCESSING DEVICE

WAVEFORM ANALYZER

WAVEFORM ANALYZER

METHOD AND DEVICE FOR PROCESSING DATA

PEAK DETECTION METHOD AND DATA PROCESSING DEVICE

PEAK DETECTION METHOD AND DATA PROCESSING DEVICE

CONTROLLING APPARATUS