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Shinji KANAZAWA

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Document search support device
    • Patent number 11,880,374
    • Issue date Jan 23, 2024
    • Shimadzu Corporation
    • Shinji Kanazawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Peak detection method and data processing device
    • Patent number 11,499,950
    • Issue date Nov 15, 2022
    • Shimadzu Corporation
    • Shinji Kanazawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Waveform analyzer
    • Patent number 11,486,866
    • Issue date Nov 1, 2022
    • Shimadzu Corporation
    • Takeshi Osoekawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Peak detection method and data processing device
    • Patent number 11,327,058
    • Issue date May 10, 2022
    • Shimadzu Corporation
    • Shinji Kanazawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and device for processing data
    • Patent number 11,321,425
    • Issue date May 3, 2022
    • Shimadzu Corporation
    • Shinji Kanazawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Waveform analyzer
    • Patent number 11,302,039
    • Issue date Apr 12, 2022
    • Shimadzu Corporation
    • Takeshi Osoekawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Controlling apparatus
    • Patent number 10,416,136
    • Issue date Sep 17, 2019
    • Shimadzu Corporation
    • Shinji Kanazawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Training Method
    • Publication number 20230296572
    • Publication date Sep 21, 2023
    • Shimadzu Corporation
    • Kenta CHINOMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    DATA GENERATION METHOD AND DEVICE, AND DISCRIMINATOR GENERATION MET...
    • Publication number 20230280317
    • Publication date Sep 7, 2023
    • Shimadzu Corporation
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Training Support Method
    • Publication number 20230267312
    • Publication date Aug 24, 2023
    • Shimadzu Corporation
    • Kenta CHINOMI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    ANALYSIS DEVICE AND ANALYSIS METHOD
    • Publication number 20230243789
    • Publication date Aug 3, 2023
    • Shimadzu Corporation
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Document Search Support Device
    • Publication number 20220382767
    • Publication date Dec 1, 2022
    • Shimadzu Corporation
    • Shinji KANAZAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Waveform Analytical Method and Waveform Analytical Device
    • Publication number 20220373522
    • Publication date Nov 24, 2022
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYTICAL DEVICE AND ANALYTICAL METHOD
    • Publication number 20220221434
    • Publication date Jul 14, 2022
    • Osaka University
    • Fumio MATSUDA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    ANALYZER
    • Publication number 20220196615
    • Publication date Jun 23, 2022
    • SHIMADZU CORPORATION
    • Yohei YAMADA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR CREATING DISCRIMINATOR
    • Publication number 20220128532
    • Publication date Apr 28, 2022
    • Shimadzu Corporation
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
    • Publication number 20200378933
    • Publication date Dec 3, 2020
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAVEFORM ANALYZER
    • Publication number 20200292509
    • Publication date Sep 17, 2020
    • SHIMADZU CORPORATION
    • Takeshi OSOEKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAVEFORM ANALYZER
    • Publication number 20200279408
    • Publication date Sep 3, 2020
    • SHIMADZU CORPORATION
    • Takeshi OSOEKAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD AND DEVICE FOR PROCESSING DATA
    • Publication number 20190129917
    • Publication date May 2, 2019
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
    • Publication number 20190113486
    • Publication date Apr 18, 2019
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
    • Publication number 20190064130
    • Publication date Feb 28, 2019
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTROLLING APPARATUS
    • Publication number 20170146500
    • Publication date May 25, 2017
    • SHIMADZU CORPORATION
    • Shinji KANAZAWA
    • G01 - MEASURING TESTING