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Shinji Miyauchi
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
Patent number
11,796,491
Issue date
Oct 24, 2023
Shimadzu Corporation
Shinji Miyauchi
G01 - MEASURING TESTING
Information
Patent Grant
Grating, negative and replica gratings of the grating, and method o...
Patent number
8,092,701
Issue date
Jan 10, 2012
Shimadzu Corporation
Tetsuya Nagano
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
X-Ray Spectroscopic Analysis Apparatus and Elemental Analysis Method
Publication number
20220214291
Publication date
Jul 7, 2022
Shimadzu Corporation
Shinji MIYAUCHI
G01 - MEASURING TESTING
Information
Patent Application
GRATING, NEGATIVE AND REPLICA GRATINGS OF THE GRATING, AND METHOD O...
Publication number
20080088930
Publication date
Apr 17, 2008
Shimadzu Corporation
Tetsuya Nagano
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
GRATING, NEGATIVE AND REPLICA GRATINGS OF THE GRATING, AND METHOD O...
Publication number
20060216478
Publication date
Sep 28, 2006
Shimadzu Corporation
Tetsuya Nagano
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
Grating, negative and replica gratings of the grating, and method o...
Publication number
20030124313
Publication date
Jul 3, 2003
Shimadzu Corporation
Tetsuya Nagano
G02 - OPTICS