Shinji Nagai

Person

Hitachinaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion trap mass spectrometry method
- Patent number 7,989,764
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectroscope and method of calibrating the same
- Patent number 7,381,948
- Issue date Jun 3, 2008
- Hitachi High-Technologies Corporation
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Patent number 7,186,973
- Issue date Mar 6, 2007
- Hitachi High-Technologies Corporation
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectroscope and method of calibrating the same
- Patent number 7,115,862
- Issue date Oct 3, 2006
- Hitachi High-Technologies Corporation
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 7,075,069
- Issue date Jul 11, 2006
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer and spectrometry
- Patent number 6,683,303
- Issue date Jan 27, 2004
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass spectrometry on an ion-trap method
- Patent number 6,633,033
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric analysis method and apparatus using the method
- Patent number 6,573,492
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20110248157
- Publication date Oct 13, 2011
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20090179148
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass spectrometry method
- Publication number 20080054173
- Publication date Mar 6, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectroscope and method of calibrating the same
- Publication number 20070069123
- Publication date Mar 29, 2007
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Publication number 20050279926
- Publication date Dec 22, 2005
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectroscope and method of calibrating the same
- Publication number 20050139763
- Publication date Jun 30, 2005
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20030205667
- Publication date Nov 6, 2003
- Hitachi, Ltd
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass spectrometer and spectrometry
- Publication number 20020162958
- Publication date Nov 7, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for mass spectrometry on an ion-trap method
- Publication number 20020008199
- Publication date Jan 24, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric analysis method and apparatus using the method
- Publication number 20010007349
- Publication date Jul 12, 2001
- Hitachi, Ltd.
- Shinji Nagai
- H01 - BASIC ELECTRIC ELEMENTS

Shinji Nagai

Person

Patents Grantslast 30 patents

Ion trap mass spectrometry method

Mass spectroscope and method of calibrating the same

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectroscope and method of calibrating the same

Apparatus for mass spectrometry on an ion-trap method

Ion trap mass spectrometer and spectrometry

Apparatus for mass spectrometry on an ion-trap method

Mass spectrometric analysis method and apparatus using the method

Patents Applicationslast 30 patents

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

Ion trap mass spectrometry method

Mass spectroscope and method of calibrating the same

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectroscope and method of calibrating the same

Apparatus for mass spectrometry on an ion-trap method

Ion trap mass spectrometer and spectrometry

Apparatus for mass spectrometry on an ion-trap method

Mass spectrometric analysis method and apparatus using the method