Shinji Semba

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with terminals, and method of manufacturing th...
- Patent number 7,348,191
- Issue date Mar 25, 2008
- Renesas Technology Corp.
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with terminals, and method of manufacturing th...
- Patent number 7,166,490
- Issue date Jan 23, 2007
- Renesas Technology Corp.
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting protrusion of inspection object from palette an...
- Patent number 6,955,264
- Issue date Oct 18, 2005
- Renesas Technology Corp.
- Toshiya Ijichi
- G01 - MEASURING TESTING
Information Patent Grant
Lead frame, and method for manufacturing semiconductor device and m...
- Patent number 6,836,004
- Issue date Dec 28, 2004
- Renesas Technology Corp.
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transporting apparatus for semiconductor device
- Patent number 6,163,145
- Issue date Dec 19, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Hiromichi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor device and test apparatus for the same
- Patent number 5,578,919
- Issue date Nov 26, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING
Information Patent Grant
Tape carrier, and test apparatus for the same
- Patent number 5,517,036
- Issue date May 14, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device with terminals, and method of manufacturing th...
- Publication number 20060240596
- Publication date Oct 26, 2006
- Renesas Technology Corp.
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
.Lead frame, and method for manufacturing semiconductor device and...
- Publication number 20040018663
- Publication date Jan 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with terminals, and method of manufacturing th...
- Publication number 20040007783
- Publication date Jan 15, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Kazunari Michii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of detecting protrusion of inspection object from palette an...
- Publication number 20030104642
- Publication date Jun 5, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiya Ijichi
- G01 - MEASURING TESTING

Shinji Semba

Person

Patents Grantslast 30 patents

Semiconductor device with terminals, and method of manufacturing th...

Semiconductor device with terminals, and method of manufacturing th...

Method of detecting protrusion of inspection object from palette an...

Lead frame, and method for manufacturing semiconductor device and m...

Transporting apparatus for semiconductor device

Method of testing semiconductor device and test apparatus for the same

Tape carrier, and test apparatus for the same

Patents Applicationslast 30 patents

Semiconductor device with terminals, and method of manufacturing th...

.Lead frame, and method for manufacturing semiconductor device and...

Semiconductor device with terminals, and method of manufacturing th...

Method of detecting protrusion of inspection object from palette an...