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Shinji Sugita
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Nara, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
10,605,748
Issue date
Mar 31, 2020
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus
Patent number
10,545,101
Issue date
Jan 28, 2020
Omron Corporation
Shinji Sugita
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray inspection apparatus and control method
Patent number
10,054,432
Issue date
Aug 21, 2018
Omron Corporation
Hironori Kasahara
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image forming apparatus having air cleaning function
Patent number
9,158,277
Issue date
Oct 13, 2015
Sharp Kabushiki Kaisha
Yuhi Akagawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image forming apparatus
Patent number
8,687,998
Issue date
Apr 1, 2014
Sharp Kabushiki Kaisha
Yuhi Akagawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image forming apparatus having an ion generating function
Patent number
8,509,647
Issue date
Aug 13, 2013
Sharp Kabushiki Kaisha
Yuhi Akagawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
X-ray inspecting apparatus and X-ray inspecting method
Patent number
8,391,581
Issue date
Mar 5, 2013
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
8,254,519
Issue date
Aug 28, 2012
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Grant
Fixing device
Patent number
7,391,984
Issue date
Jun 24, 2008
Sharp Kabushiki Kaisha
Shinji Sugita
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Gear mechanism and image forming apparatus using same
Patent number
7,245,858
Issue date
Jul 17, 2007
Sharp Kabushiki Kaisha
Tomohiko Okada
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image processing apparatus with attachable/detachable functional units
Patent number
6,219,507
Issue date
Apr 17, 2001
Sharp Kabushiki Kaisha
Yoshiharu Yoneda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
COMPONENT INSPECTION DEVICE
Publication number
20240070847
Publication date
Feb 29, 2024
Omron Corporation
Aoi MOCHIZUKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND CONTROL METHOD
Publication number
20180080763
Publication date
Mar 22, 2018
Omron Corporation
Hironori KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
Publication number
20170356859
Publication date
Dec 14, 2017
Omron Corporation
Shinji SUGITA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS
Publication number
20170356860
Publication date
Dec 14, 2017
Omron Corporation
Shinji SUGITA
G01 - MEASURING TESTING
Information
Patent Application
DATA STRUCTURE, LIBRARY CREATION DEVICE, ELECTRONIC DEVICE ANALYSIS...
Publication number
20160267443
Publication date
Sep 15, 2016
Omron Corporation
Atsushi Hisano
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Application
IMAGE FORMING APPARATUS
Publication number
20140161482
Publication date
Jun 12, 2014
SHARP KABUSHIKI KAISHA
YUHI AKAGAWA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
IMAGE FORMING APPARATUS
Publication number
20130322914
Publication date
Dec 5, 2013
SHARP KABUSHIKI KAISHA
YUHI AKAGAWA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
Publication number
20110255660
Publication date
Oct 20, 2011
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
Publication number
20110249795
Publication date
Oct 13, 2011
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
Publication number
20110243299
Publication date
Oct 6, 2011
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
Publication number
20110222647
Publication date
Sep 15, 2011
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Application
IMAGE FORMING APPARATUS
Publication number
20110188879
Publication date
Aug 4, 2011
Yuhi Akagawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
Publication number
20100329532
Publication date
Dec 30, 2010
OMRON CORPORATION
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Application
Fixing device
Publication number
20060159479
Publication date
Jul 20, 2006
Sharp Kabushiki Kaisha
Shinji Sugita
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Gear mechanism and image forming apparatus using same
Publication number
20050163535
Publication date
Jul 28, 2005
Sharp Kabushiki Kaisha
Tomohiko Okada
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY