Shinji Yoshihara

Person

Anjo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device capable of restricting coil extension directio...
- Patent number 8,610,246
- Issue date Dec 17, 2013
- Denso Corporation
- Shinji Yoshihara
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical device having optical waveguide and method for manufacturin...
- Patent number 7,174,072
- Issue date Feb 6, 2007
- Denso Corporation
- Junji Oohara
- G02 - OPTICS
Information Patent Grant
Semiconductor device and method for producing the same by dicing
- Patent number 7,091,109
- Issue date Aug 15, 2006
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device having passivation cap and method for manufact...
- Patent number 6,995,466
- Issue date Feb 7, 2006
- Denso Corporation
- Shinji Yoshihara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for manufacturing a dynamic quantity detection device
- Patent number 6,960,487
- Issue date Nov 1, 2005
- Nippon Soken, Inc.
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor dynamic quantity sensor
- Patent number 6,938,501
- Issue date Sep 6, 2005
- Denso Corporation
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a dynamic quantity detection device
- Patent number 6,858,451
- Issue date Feb 22, 2005
- Denso Corporation
- Yasutoshi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a flat protective adhesive sheet
- Patent number 6,787,929
- Issue date Sep 7, 2004
- Denso Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor sensor chip having diaphragm and method of manufactur...
- Patent number 6,747,329
- Issue date Jun 8, 2004
- Denso Corporation
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor dynamic quantity sensor
- Patent number 6,658,948
- Issue date Dec 9, 2003
- Denso Corporation
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including eutectic bonding portion and method...
- Patent number 6,555,901
- Issue date Apr 29, 2003
- Denso Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitive physical quantity detection device
- Patent number 6,450,029
- Issue date Sep 17, 2002
- Denso Corporation
- Minekazu Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device produced by dicing
- Patent number 6,429,506
- Issue date Aug 6, 2002
- Denso Corporation
- Tetsuo Fujii
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Bump bonding and sealing a semiconductor device with solder
- Patent number 6,313,529
- Issue date Nov 6, 2001
- Denso Corporation
- Shinji Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
- Patent number 6,287,885
- Issue date Sep 11, 2001
- Denso Corporation
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 6,277,756
- Issue date Aug 21, 2001
- Denso Corporation
- Junji Ohara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device with a protective sheet to affix a semiconduct...
- Patent number 6,255,741
- Issue date Jul 3, 2001
- Denso Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device with flat protective adhesive sheet and method...
- Patent number 6,245,593
- Issue date Jun 12, 2001
- Denso Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 5,824,177
- Issue date Oct 20, 1998
- Nippondenso Co., Ltd.
- Shinji Yoshihara
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method for manufacturing a semiconductor acceleration sensor device
- Patent number 5,668,033
- Issue date Sep 16, 1997
- Nippondenso Co., Ltd.
- Fumio Ohara
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method of fabricating a semiconductor pressure sensor
- Patent number 4,975,390
- Issue date Dec 4, 1990
- Nippondenso Co. Ltd.
- Tetsuo Fujii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20110248380
- Publication date Oct 13, 2011
- DENSO CORPORATION
- Shinji YOSHIHARA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Optical device having optical waveguide and method for manufacturin...
- Publication number 20050265662
- Publication date Dec 1, 2005
- DENSO Corporation
- Junji Oohara
- G02 - OPTICS
Information Patent Application
Semiconductor optical device and method for manufacturing the same
- Publication number 20050079716
- Publication date Apr 14, 2005
- DENSO Corporation
- Shinji Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for producing the same by dicing
- Publication number 20040259330
- Publication date Dec 23, 2004
- Tetsuo Fujii
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Semiconductor dynamic quantity sensor
- Publication number 20040166601
- Publication date Aug 26, 2004
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having passivation cap and method for manufact...
- Publication number 20040140534
- Publication date Jul 22, 2004
- DENSO Corporation
- Shinji Yoshihara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for manufacturing a dynamic quantity detection device
- Publication number 20030203528
- Publication date Oct 30, 2003
- Yasutoshi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing a dynamic quantity detection device
- Publication number 20030194836
- Publication date Oct 16, 2003
- Yasutoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor dynamic quantity sensor
- Publication number 20020100948
- Publication date Aug 1, 2002
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method for producing the same by dicing
- Publication number 20020093076
- Publication date Jul 18, 2002
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor sensor chip having diaphragm and method of manufactur...
- Publication number 20020079549
- Publication date Jun 27, 2002
- Shinji Yoshihara
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with flat protective adhesive sheet and method...
- Publication number 20010008300
- Publication date Jul 19, 2001
- IPICS Corporation
- Shinji Yoshihara
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Shinji Yoshihara

Person

Patents Grantslast 30 patents

Semiconductor device capable of restricting coil extension directio...

Optical device having optical waveguide and method for manufacturin...

Semiconductor device and method for producing the same by dicing

Semiconductor device having passivation cap and method for manufact...

Method for manufacturing a dynamic quantity detection device

Semiconductor dynamic quantity sensor

Method for manufacturing a dynamic quantity detection device

Semiconductor device having a flat protective adhesive sheet

Semiconductor sensor chip having diaphragm and method of manufactur...

Semiconductor dynamic quantity sensor

Semiconductor device including eutectic bonding portion and method...

Capacitive physical quantity detection device

Semiconductor device produced by dicing

Bump bonding and sealing a semiconductor device with solder

Method for manufacturing semiconductor dynamic quantity sensor

Method for manufacturing semiconductor device

Semiconductor device with a protective sheet to affix a semiconduct...

Semiconductor device with flat protective adhesive sheet and method...

Method for manufacturing a semiconductor device

Method for manufacturing a semiconductor acceleration sensor device

Method of fabricating a semiconductor pressure sensor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

Optical device having optical waveguide and method for manufacturin...

Semiconductor optical device and method for manufacturing the same

Semiconductor device and method for producing the same by dicing

Semiconductor dynamic quantity sensor

Semiconductor device having passivation cap and method for manufact...

Method for manufacturing a dynamic quantity detection device

Method for manufacturing a dynamic quantity detection device

Semiconductor dynamic quantity sensor

Semiconductor device and method for producing the same by dicing

Semiconductor sensor chip having diaphragm and method of manufactur...

Semiconductor device with flat protective adhesive sheet and method...