Membership
Tour
Register
Log in
Shinji Yoshioka
Follow
Person
Hitachinaka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Substance analyzer and substance analysis method
Patent number
11,776,800
Issue date
Oct 3, 2023
HITACHI HIGH-TECH CORPORATION
Yasuaki Takada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Liquid chromatography-mass spectrometry device
Patent number
9,921,195
Issue date
Mar 20, 2018
Hitachi High-Technologies Corporation
Mitsuhiro Umeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chromatograph mass spectrometer and control method therefor
Patent number
9,823,228
Issue date
Nov 21, 2017
Hitachi High-Technologies Corporation
Shinji Yoshioka
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer and mass spectrometry method
Patent number
8,829,434
Issue date
Sep 9, 2014
Hitachi High-Technologies Corporation
Hiroyuki Yasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry device and method using ion-molecule reaction ion...
Patent number
8,710,434
Issue date
Apr 29, 2014
Hitachi High-Technologies Corporation
Shinji Yoshioka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectroscope and mass spectrometry
Patent number
8,274,044
Issue date
Sep 25, 2012
Hitachi High-Technologies Corporation
Shinji Yoshioka
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE-ANALYZING APPARATUS
Publication number
20220412848
Publication date
Dec 29, 2022
Hitachi High-Tech Corporation
Akimasa Osaka
G01 - MEASURING TESTING
Information
Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
Publication number
20220359182
Publication date
Nov 10, 2022
HITACHI HIGH-TECH CORPORATION
Yasuaki TAKADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHROMATOGRAPH MASS SPECTROMETER AND CONTROL METHOD THEREFOR
Publication number
20170097328
Publication date
Apr 6, 2017
Hitachi High-Technologies Corporation
Shinji Yoshioka
G01 - MEASURING TESTING
Information
Patent Application
Liquid Chromatography-Mass Spectrometry Device
Publication number
20160327527
Publication date
Nov 10, 2016
HITACHI HICH-TECHNOLOGIES CORPORATION
Mitsuhiro UMEDA
G01 - MEASURING TESTING
Information
Patent Application
MASS ANALYSIS METHOD AND MASS ANALYSIS SYSTEM
Publication number
20150198569
Publication date
Jul 16, 2015
Hitachi High-Technologies Corporation
Noriko Baba
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CHROMATOGRAPHY MASS SPECTROMETER DEVICE
Publication number
20140131570
Publication date
May 15, 2014
Hitachi High-Technologies Corporation
Shinji Yoshioka
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
Publication number
20130228682
Publication date
Sep 5, 2013
Hitachi High-Technologies Corporation
Hiroyuki Yasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometry Device and Method Using Ion-Molecule Reaction Ion...
Publication number
20120326021
Publication date
Dec 27, 2012
Hitachi High-Technologies Corporation
Shinji Yoshioka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIQUID CHROMATOGRAPHY/MASS SPECTROMETRY DEVICE AND ANALYSIS METHOD...
Publication number
20120306883
Publication date
Dec 6, 2012
Hitachi High-Technologies Corporation
Shinji Yoshioka
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROSCOPE AND MASS SPECTROMETRY
Publication number
20110121174
Publication date
May 26, 2011
Shinji Yoshioka
H01 - BASIC ELECTRIC ELEMENTS