Shinjiro Kondo

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Kounosu-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focus test mask, focus measurement method, exposure method and expo...
- Patent number 8,343,693
- Issue date Jan 1, 2013
- Nikon Corporation
- Shigeru Hirukawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring shot shape and mask
- Patent number 8,339,614
- Issue date Dec 25, 2012
- Nikon Corporation
- Shinjiro Kondo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Focus test mask, focus measurement method and exposure apparatus
- Patent number 7,426,017
- Issue date Sep 16, 2008
- Nikon Corporation
- Shinjiro Kondo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imaging characteristic and asymetric abrerration measurement of pro...
- Patent number 5,615,006
- Issue date Mar 25, 1997
- Nikon Corporation
- Shigeru Hirukawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
FOCUS TEST MASK, FOCUS MEASUREMENT METHOD, EXPOSURE METHOD AND EXPO...
- Publication number 20110212389
- Publication date Sep 1, 2011
- Nikon Corporation
- Shigeru HIRUKAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring Shot Shape and Mask
- Publication number 20090033948
- Publication date Feb 5, 2009
- Nikon Corporation
- Shinjiro Kondo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Focus test mask, focus measurement method and exposure apparatus
- Publication number 20060103825
- Publication date May 18, 2006
- Nikon Corporation
- Shinjiro Kondo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY