Shinsuke Kawanishi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 10,157,724
- Issue date Dec 18, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting height of sample and observation system
- Patent number 10,141,157
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Makoto Nakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 9,875,877
- Issue date Jan 23, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, image generation method, observation...
- Patent number 9,824,854
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device, specimen-image acquisition method, an...
- Patent number 9,741,530
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample image acquiring method
- Patent number 9,741,526
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diaphragm mounting member and charged particle beam device
- Patent number 9,633,817
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample storage container, charged particle beam apparatus, and imag...
- Patent number 9,564,288
- Issue date Feb 7, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and filter member
- Patent number 9,373,480
- Issue date Jun 21, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 9,362,083
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin membrane holder for an electron microscope
- Patent number D748706
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- D16 - Photography and optical equipment
Information Patent Grant
Charged particle beam device, position adjusting method for diaphra...
- Patent number 9,251,996
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,240,305
- Issue date Jan 19, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 9,236,217
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin membrane holder for an electron microscope
- Patent number D731570
- Issue date Jun 9, 2015
- Hitachi High-Technologies Corporation
- Yasuke Ominami
- D16 - Photography and optical equipment
Information Patent Grant
Base of a thin membrane holder for an electron microscope
- Patent number D730962
- Issue date Jun 2, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- D16 - Photography and optical equipment
Information Patent Grant
Scanning electron microscope with a table being guided by rolling f...
- Patent number 8,969,828
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Naoki Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 8,933,400
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Lamella Mounting Method, and Analysis System
- Publication number 20240412941
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Wei Chean TAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
- Publication number 20230268156
- Publication date Aug 24, 2023
- Hitachi High-Tech Corporation
- Naoki SAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Adjusting Height of Sample and Observation System
- Publication number 20180174796
- Publication date Jun 21, 2018
- Hitachi High-Technologies Corporation
- Makoto NAKABAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20180122617
- Publication date May 3, 2018
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20160343538
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...
- Publication number 20160336145
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...
- Publication number 20160329188
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Image Acquiring Method
- Publication number 20160203944
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diaphragm Mounting Member and Charged Particle Beam Device
- Publication number 20160203941
- Publication date Jul 14, 2016
- HITACHI-TECHNOLOGIES CORPORATION
- Shinsuke KAWANISHI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Filter Member
- Publication number 20160071685
- Publication date Mar 10, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...
- Publication number 20150311033
- Publication date Oct 29, 2015
- HITACHI HIGH-TECHNOLOGY CORPORATION
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Storage Container, Charged Particle Beam Apparatus, and Imag...
- Publication number 20150255244
- Publication date Sep 10, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20150235803
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corpration
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Observation Apparatus and Optical Axis Adjustment Method
- Publication number 20150228448
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Position Adjusting Method for Diaphra...
- Publication number 20150228449
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
- Publication number 20150221470
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150213999
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20150129763
- Publication date May 14, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20150083908
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20140246583
- Publication date Sep 4, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130056636
- Publication date Mar 7, 2013
- Hitachi High-Technologies Corporation
- Shigeru Haneda
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130048854
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Naoki Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS

Shinsuke Kawanishi

Person

Patents Grantslast 30 patents

Electron scanning microscope and image generation method

Method for adjusting height of sample and observation system

Electron scanning microscope and image generation method

Charged particle beam device, image generation method, observation...

Charged-particle-beam device, specimen-image acquisition method, an...

Charged particle beam apparatus and sample image acquiring method

Diaphragm mounting member and charged particle beam device

Sample storage container, charged particle beam apparatus, and imag...

Charged particle beam device, sample stage unit, and sample observa...

Observation apparatus and optical axis adjustment method

Charged particle beam device and filter member

Charged particle beam apparatus and sample observation method

Charged particle beam device

Thin membrane holder for an electron microscope

Charged particle beam device, position adjusting method for diaphra...

Charged particle beam device and sample observation method

Inspection or observation apparatus and sample inspection or observ...

Thin membrane holder for an electron microscope

Base of a thin membrane holder for an electron microscope

Scanning electron microscope with a table being guided by rolling f...

Inspection or observation apparatus and sample inspection or observ...

Patents Applicationslast 30 patents

Lamella Mounting Method, and Analysis System

Tweezers, Conveyance Device, and Method for Conveying Sample Piece

Method for Adjusting Height of Sample and Observation System

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...

CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...

Charged Particle Beam Apparatus and Sample Image Acquiring Method

Diaphragm Mounting Member and Charged Particle Beam Device

Charged Particle Beam Device and Filter Member

Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...

Sample Storage Container, Charged Particle Beam Apparatus, and Imag...

Charged Particle Beam Device and Sample Observation Method

Observation Apparatus and Optical Axis Adjustment Method

Charged Particle Beam Device, Position Adjusting Method for Diaphra...

Charged Particle Beam Apparatus and Sample Observation Method

Charged Particle Beam Apparatus

Charged Particle Beam Device

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE