Shinsuke SUZUKI

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Hamamatsu-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,971,364
- Issue date Apr 30, 2024
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection device, and marking forming method
- Patent number 10,923,404
- Issue date Feb 16, 2021
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system and inspection method
- Patent number 10,607,900
- Issue date Mar 31, 2020
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Inspection method, inspection device, and marking forming method
- Patent number 10,586,743
- Issue date Mar 10, 2020
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,312,166
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20230061399
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20210270752
- Publication date Sep 2, 2021
- Hamamatsu Photonics K.K.
- Shinsuke SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD
- Publication number 20200152525
- Publication date May 14, 2020
- HAMAMATSU PHOTONICS K. K.
- Shinsuke SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD
- Publication number 20190371682
- Publication date Dec 5, 2019
- Hamamatsu Photonics K.K.
- Shinsuke SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190221486
- Publication date Jul 18, 2019
- HAMAMATSU PHOTONICS K. K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180033704
- Publication date Feb 1, 2018
- Hamamatsu Photonics K.K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR