Shinsuke TAKEDA

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,571,412
- Issue date Feb 25, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,533,958
- Issue date Jan 14, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,502,699
- Issue date Dec 10, 2019
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,322,788
- Issue date Apr 26, 2016
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,240,356
- Issue date Jan 19, 2016
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,196,550
- Issue date Nov 24, 2015
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD
- Publication number 20170219499
- Publication date Aug 3, 2017
- Nikon Corporation
- Toshihisa TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...
- Publication number 20160041108
- Publication date Feb 11, 2016
- Nikon Corporation
- Kazuhiko FUKAZAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...
- Publication number 20120164763
- Publication date Jun 28, 2012
- Kazuhiko FUKAZAWA
- G02 - OPTICS