Shinsuke Watanabe

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Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of producing a semiconductor dynamic sensor
- Patent number 5,549,785
- Issue date Aug 27, 1996
- Nippondenso Co., Ltd.
- Minekazu Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing an acceleration sensor of a semiconductor
- Patent number 5,223,086
- Issue date Jun 29, 1993
- Nippondenso Co., Ltd.
- Masakazu Terada
- G01 - MEASURING TESTING