Shintaro ANDO

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Ayabe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Detection system, detection device, and detection method
- Patent number 10,514,458
- Issue date Dec 24, 2019
- Omron Corporation
- Shintaro Ando
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR DEVICE
- Publication number 20240255619
- Publication date Aug 1, 2024
- Omron Corporation
- Norihiro Tomago
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR AND DETECTION METHOD
- Publication number 20190128732
- Publication date May 2, 2019
- Omron Corporation
- Shintaro ANDO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD
- Publication number 20180217259
- Publication date Aug 2, 2018
- Omron Corporation
- Shintaro ANDO
- G01 - MEASURING TESTING