Shintaro Komatani

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample cell for fluorescent X-ray analysis and sample cell assembly...
- Patent number 8,550,710
- Issue date Oct 8, 2013
- Horiba, Ltd.
- Mayuko Kishida
- G01 - MEASURING TESTING
Information Patent Grant
X-ray convergence element and X-ray irradiation device
- Patent number 8,416,921
- Issue date Apr 9, 2013
- Horiba, Ltd.
- Hiromoto Nakazawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Analytical sample drying method and drying apparatus
- Patent number 8,001,854
- Issue date Aug 23, 2011
- Railway Technical Research Institute
- Hiroyuki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Element analyzer
- Patent number 6,762,834
- Issue date Jul 13, 2004
- Horiba Ltd.
- Shintaro Komatani
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer system and method of increasing response time
- Patent number 5,570,406
- Issue date Oct 29, 1996
- Horiba, Ltd.
- Shintaro Komatani
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analyzer and monitoring system for increasing ope...
- Patent number 5,398,274
- Issue date Mar 14, 1995
- Horiba, Ltd.
- Shintaro Komatani
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray analyzer with self-correcting feature
- Patent number 5,179,580
- Issue date Jan 12, 1993
- Horiba Ltd.
- Shintaro Komatani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE CELL FOR FLUORESCENT X-RAY ANALYSIS AND SAMPLE CELL ASSEMBLY...
- Publication number 20110085638
- Publication date Apr 14, 2011
- Mayuko Kishida
- G01 - MEASURING TESTING
Information Patent Application
X-RAY CONVERGENCE ELEMENT AND X-RAY IRRADIATION DEVICE
- Publication number 20100226477
- Publication date Sep 9, 2010
- Hiromoto Nakazawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ANALYTICAL SAMPLE DRYING METHOD AND DRYING APPARATUS
- Publication number 20100031758
- Publication date Feb 11, 2010
- RAILWAY TECHNICAL RESEARCH INSTITUTE
- Hiroyuki Sakai
- G01 - MEASURING TESTING
Information Patent Application
Element analyzer
- Publication number 20030156282
- Publication date Aug 21, 2003
- HORIBA, LTD.
- Shintaro Komatani
- G01 - MEASURING TESTING