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Shintaro Yamamoto
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Nabari, JP
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last 30 patents
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Patent Grant
Optically scanning displacement sensor with linearity correction means
Patent number
4,864,147
Issue date
Sep 5, 1989
Matsushita Electric Works, Ltd.
Motoo Ikari
G01 - MEASURING TESTING
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Patent Grant
Optical displacement measuring system with nonlinearity correction
Patent number
4,761,546
Issue date
Aug 2, 1988
Matsushita Electric Works, Ltd.
Motoo Ikari
G01 - MEASURING TESTING