Shintarou Hisatake

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave measurement apparatus and electromagnetic wave...
- Patent number 11,054,455
- Issue date Jul 6, 2021
- Osaka University
- Shintarou Hisatake
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe, electromagnetic wave measuring apparatus, and...
- Patent number 10,761,126
- Issue date Sep 1, 2020
- Osaka University
- Shintarou Hisatake
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring electromagnetic field, electromagnetic field m...
- Patent number 10,451,663
- Issue date Oct 22, 2019
- Osaka University
- Shintarou Hisatake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electromagnetic Wave Measurement Apparatus and Electromagnetic Wave...
- Publication number 20200011913
- Publication date Jan 9, 2020
- OSAKA UNIVERSITY
- Shintarou Hisatake
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING ELECTROMAGNETIC FIELD, ELECTROMAGNETIC FIELD M...
- Publication number 20180238948
- Publication date Aug 23, 2018
- OSAKA UNIVERSITY
- Shintarou HISATAKE
- G01 - MEASURING TESTING
Information Patent Application
Electro-Optic Probe, Electromagnetic Wave Measuring Apparatus, and...
- Publication number 20180188305
- Publication date Jul 5, 2018
- OSAKA UNIVERSITY
- Shintarou Hisatake
- G01 - MEASURING TESTING