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Shinwu Chiang
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Yorktown Heights, NY, US
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last 30 patents
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Patent Grant
System and method for testing and fault isolation of high density p...
Patent number
5,621,327
Issue date
Apr 15, 1997
International Business Machines Corporation
Shinwu Chiang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing and fault isolation of high density p...
Patent number
5,402,072
Issue date
Mar 28, 1995
International Business Machines Corporation
Shinwu Chiang
G01 - MEASURING TESTING