Shinya Fujita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scatter diagram display device and surface analyzer
- Patent number 9,874,532
- Issue date Jan 23, 2018
- Jeol Ltd.
- Norihisa Mori
- G01 - MEASURING TESTING
Information Patent Grant
Phase analyzer, phase analysis method, and surface analyzer
- Patent number 9,518,942
- Issue date Dec 13, 2016
- Jeol Ltd.
- Naoki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wavelength dispersion probing system
- Patent number 7,020,360
- Issue date Mar 28, 2006
- Advantest Corporation
- Hiroaki Satomura
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method for optical short-pulse waveform
- Patent number 5,909,659
- Issue date Jun 1, 1999
- Advantest Corporation
- Shinya Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scatter Diagram Display Device and Surface Analyzer
- Publication number 20160110896
- Publication date Apr 21, 2016
- JEOL Ltd.
- Norihisa Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Phase Analyzer, Phase Analysis Method, and Surface Analyzer
- Publication number 20150362446
- Publication date Dec 17, 2015
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
Wavelength dispersion probing system
- Publication number 20050094936
- Publication date May 5, 2005
- Hiroaki Satomura
- G01 - MEASURING TESTING