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Shinya Hara
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,921,065
Issue date
Mar 5, 2024
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer and control method for x-ray fluore...
Patent number
11,698,352
Issue date
Jul 11, 2023
Rigaku Corporation
Yoshihisa Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,656,190
Issue date
May 23, 2023
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,156,569
Issue date
Oct 26, 2021
Rigaku Corporation
Yasujiro Yamada
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
10,161,889
Issue date
Dec 25, 2018
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
10,082,475
Issue date
Sep 25, 2018
Rigaku Corporation
Shinya Hara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
10,012,605
Issue date
Jul 3, 2018
Rigaku Corporation
Yasujiro Yamada
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer and program used therein
Patent number
7,961,842
Issue date
Jun 14, 2011
Rigaku Corporation
Naoki Kawahara
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer and program used therein
Patent number
7,187,751
Issue date
Mar 6, 2007
Rigaku Industrial Corporation
Naoki Kawahara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20230393084
Publication date
Dec 7, 2023
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20230044361
Publication date
Feb 9, 2023
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND CONTROL METHOD FOR X-RAY FLUORE...
Publication number
20220349847
Publication date
Nov 3, 2022
Yoshihisa YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20210262954
Publication date
Aug 26, 2021
Rigaku Corporation
Yasujiro YAMADA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20180180563
Publication date
Jun 28, 2018
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20180106736
Publication date
Apr 19, 2018
Rigaku Corporation
Shinya HARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20170322165
Publication date
Nov 9, 2017
Rigaku Corporation
Yasujiro YAMADA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
Publication number
20090041184
Publication date
Feb 12, 2009
RIGAKU INDUSTRIAL CORPORATION
Naoki Kawahara
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
Publication number
20060274882
Publication date
Dec 7, 2006
RIGAKU INDUSTRIAL CORPORATION
Naoki Kawahara
G01 - MEASURING TESTING