Shinya Kitayama

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Composite charged particle beam apparatus
- Patent number 11,462,381
- Issue date Oct 4, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 10,903,040
- Issue date Jan 26, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 10,312,051
- Issue date Jun 4, 2019
- Hitachi High-Tech Science Corporation
- Hiroyuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for probe shape processing by ion beam
- Patent number 9,202,672
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and machining method
- Patent number 9,111,721
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle device
- Patent number 8,927,930
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Hirohisa Enomoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method using a...
- Patent number 8,791,413
- Issue date Jul 29, 2014
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Sample Analysis Method
- Publication number 20240170250
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Masayoshi YOSHIOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210151283
- Publication date May 20, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190259569
- Publication date Aug 22, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160093464
- Publication date Mar 31, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE
- Publication number 20140197331
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Hirohisa Enomoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND MACHINING METHOD
- Publication number 20130334034
- Publication date Dec 19, 2013
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20130146765
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE
- Publication number 20130126750
- Publication date May 23, 2013
- Hirohisa Enomoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD
- Publication number 20130032714
- Publication date Feb 7, 2013
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS

Shinya Kitayama

Person

Patents Grantslast 30 patents

Composite charged particle beam apparatus

Composite charged particle beam apparatus

Composite charged particle beam apparatus

Apparatus and method for probe shape processing by ion beam

Ion beam device and machining method

Charged particle device

Charged particle beam device and sample observation method using a...

Patents Applicationslast 30 patents

Charged Particle Beam Device and Sample Analysis Method

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE DEVICE

ION BEAM DEVICE AND MACHINING METHOD

Charged Particle Beam Device and Sample Observation Method

CHARGED PARTICLE DEVICE

ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD