Shinya Koizumi

Follow

Person

Nirasaki City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for thermal stabilization of probe card and inspection appar...
- Patent number 9,030,218
- Issue date May 12, 2015
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and method for correcting contact position by adjus...
- Patent number 8,130,004
- Issue date Mar 6, 2012
- Tokyo Electron Limited
- Hiroshi Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE APPARATUS, PROBE INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20200049762
- Publication date Feb 13, 2020
- TOKYO ELECTRON LIMITED
- Tomohiro Ota
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPAR...
- Publication number 20130278279
- Publication date Oct 24, 2013
- TOKYO ELECTRON LIMITED
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20120126841
- Publication date May 24, 2012
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20120119766
- Publication date May 17, 2012
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20090284277
- Publication date Nov 19, 2009
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING