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Patents Grants
last 30 patents
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Patent Grant
Magnetic flaw detection method, magnetic field measurement processi...
Patent number
11,835,483
Issue date
Dec 5, 2023
Yokogawa Electric Corporation
Shinya Mito
G01 - MEASURING TESTING
Information
Patent Grant
Thinning detection system and thinning detection method
Patent number
10,458,947
Issue date
Oct 29, 2019
Yokogawa Electric Corporation
Tetsuya Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Current sensor
Patent number
9,459,293
Issue date
Oct 4, 2016
Yokogawa Electric Corporation
Shinya Mito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DETECTION DEVICE, ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER-READ...
Publication number
20230384123
Publication date
Nov 30, 2023
YOKOGAWA ELECTRIC CORPORATION
Shinya Mito
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIZING APPARATUS AND MAGNETIZING METHOD
Publication number
20230119946
Publication date
Apr 20, 2023
YOKOGAWA ELECTRIC CORPORATION
Shoichi SHIOSAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC FLAW DETECTION METHOD, MAGNETIC FIELD MEASUREMENT PROCESSI...
Publication number
20230108846
Publication date
Apr 6, 2023
YOKOGAWA ELECTRIC CORPORATION
Shinya MITO
G01 - MEASURING TESTING
Information
Patent Application
THINNING DETECTION SYSTEM AND THINNING DETECTION METHOD
Publication number
20170307566
Publication date
Oct 26, 2017
YOKOGAWA ELECTRIC CORPORATION
Tetsuya ISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE FOREIGN MATERIAL DETECTING APPARATUS
Publication number
20150145509
Publication date
May 28, 2015
YOKOGAWA ELECTRIC CORPORATION
Kazuma TAKENAKA
G01 - MEASURING TESTING
Information
Patent Application
CURRENT SENSOR
Publication number
20150022199
Publication date
Jan 22, 2015
YOKOGAWA ELECTRIC CORPORATION
Shinya MITO
G01 - MEASURING TESTING