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Shinya NAKAGAWA
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Concentration measurement device
Patent number
11,994,481
Issue date
May 28, 2024
Omron Corporation
Susumu Kamiyama
G01 - MEASURING TESTING
Information
Patent Grant
Mixture ratio calculation device
Patent number
11,635,395
Issue date
Apr 25, 2023
Omron Corporation
Shinya Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
Internal temperature measuring apparatus and temperature difference...
Patent number
10,564,046
Issue date
Feb 18, 2020
Omron Corporation
Shinya Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
Internal temperature measuring apparatus and sensor package
Patent number
10,551,252
Issue date
Feb 4, 2020
Omron Corporation
Shinya Nakagawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Temperature difference measuring apparatus
Patent number
10,488,268
Issue date
Nov 26, 2019
Omron Corporation
Shinya Nakagawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Sensor package
Patent number
10,451,490
Issue date
Oct 22, 2019
Omron Corporation
Shinya Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
Internal temperature measurement device
Patent number
10,190,921
Issue date
Jan 29, 2019
Omron Corporation
Shinya Nakagawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Internal temperature measurement method and internal temperature me...
Patent number
10,175,120
Issue date
Jan 8, 2019
Omron Corporation
Shinya Nakagawa
G01 - MEASURING TESTING
Information
Patent Grant
MEMS internal temperature sensor having thin film thermopile
Patent number
10,060,803
Issue date
Aug 28, 2018
Omron Corporation
Shinya Nakagawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
CONCENTRATION MEASUREMENT DEVICE
Publication number
20220136988
Publication date
May 5, 2022
Omron Corporation
Susumu KAMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
MIXTURE RATIO CALCULATION DEVICE
Publication number
20210055239
Publication date
Feb 25, 2021
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE MEASUREMENT DEVICE AND PRESSURE MEASUREMENT METHOD
Publication number
20200182723
Publication date
Jun 11, 2020
OMRON Healthcare Co., Ltd.
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR PACKAGE
Publication number
20180038740
Publication date
Feb 8, 2018
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
INTERNAL TEMPERATURE MEASURING APPARATUS AND SENSOR PACKAGE
Publication number
20180024010
Publication date
Jan 25, 2018
Omron Corporation
Shinya NAKAGAWA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTERNAL TEMPERATURE MEASURING APPARATUS AND TEMPERATURE DIFFERENCE...
Publication number
20170343422
Publication date
Nov 30, 2017
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE DIFFERENCE MEASURING APPARATUS
Publication number
20170343421
Publication date
Nov 30, 2017
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
INTERNAL TEMPERATURE MEASUREMENT DEVICE
Publication number
20170276553
Publication date
Sep 28, 2017
Omron Corporation
Shinya Nakagawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTERNAL TEMPERATURE MEASUREMENT METHOD AND INTERNAL TEMPERATURE ME...
Publication number
20170016778
Publication date
Jan 19, 2017
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
INTERNAL TEMPERATURE SENSOR
Publication number
20160313193
Publication date
Oct 27, 2016
Omron Corporation
Shinya NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSOR
Publication number
20100102410
Publication date
Apr 29, 2010
Omron Corporation
Masao Shimizu
G02 - OPTICS