Shinya Nishimura

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzing apparatus and analyzing method
- Patent number 11,598,737
- Issue date Mar 7, 2023
- Hitachi High-Tech Science Corporation
- Takeshi Umemoto
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analyzer
- Patent number 11,460,425
- Issue date Oct 4, 2022
- Hitachi High-Tech Science Corporation
- Kengo Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric conversion module and method of manufacturing the same
- Patent number 10,622,532
- Issue date Apr 14, 2020
- Mitsubishi Electric Corporation
- Akira Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermo-gravimetric apparatus
- Patent number 10,088,402
- Issue date Oct 2, 2018
- Hitachi High-Tech Science Corporation
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analyzer
- Patent number 9,885,645
- Issue date Feb 6, 2018
- Hitachi High-Tech Science Corporation
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus for thermal analyzer and thermal analyzer includi...
- Patent number 9,753,509
- Issue date Sep 5, 2017
- Hitachi High-Tech Science Corporation
- Shinya Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Thermal analyzer
- Patent number 9,033,574
- Issue date May 19, 2015
- Hitachi High-Tech Science Corporation
- Kanji Nagasawa
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analyzer
- Patent number 8,708,556
- Issue date Apr 29, 2014
- SII NanoTechnology
- Kentaro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter
- Patent number 8,496,374
- Issue date Jul 30, 2013
- SII Nano Technology, Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter
- Patent number 8,342,744
- Issue date Jan 1, 2013
- SII NanoTechnology Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analysis system and method of drying the same
- Patent number 7,641,384
- Issue date Jan 5, 2010
- SII NanoTechnology Inc.
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter
- Patent number 7,455,449
- Issue date Nov 25, 2008
- SII NanoTechnology Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Differential scanning calorimeter with a second heater
- Patent number 7,275,862
- Issue date Oct 2, 2007
- SII NanoTechnology Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Cooling mechanism, cooling apparatus having cooling mechanism, and...
- Patent number 7,234,861
- Issue date Jun 26, 2007
- SII NanoTechnology Inc.
- Shinya Nishimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230155351
- Publication date May 18, 2023
- Mitsubishi Electric Corporation
- Shinya NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CONTAINER FOR THERMAL ANALYSIS AND THERMAL ANALYZER
- Publication number 20210302342
- Publication date Sep 30, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryokuhei YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYZER
- Publication number 20210285904
- Publication date Sep 16, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kengo KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
THERMOELECTRIC CONVERSION MODULE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20200028048
- Publication date Jan 23, 2020
- MITSUBISHI ELECTRIC CORPORATION
- Akira YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analyzing Apparatus and Analyzing Method
- Publication number 20190064091
- Publication date Feb 28, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takeshi Umemoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PHOTOVOLTAIC DEVICE
- Publication number 20170330990
- Publication date Nov 16, 2017
- MITSUBISHI ELECTRIC CORPORATION
- Takehiko SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging Apparatus for Thermal Analyzer and Thermal Analyzer Includi...
- Publication number 20150264277
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Thermal Analyzer
- Publication number 20150260665
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Thermal Analyzer
- Publication number 20150153292
- Publication date Jun 4, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYZER
- Publication number 20130235899
- Publication date Sep 12, 2013
- Hitachi High-Technologies Corporation
- Kenji NAGASAWA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD FOR PHOTOVOLTAIC POWER DEVICE AND MANUFACTURIN...
- Publication number 20130109128
- Publication date May 2, 2013
- Mitsubishi Electric Corporation
- Tomotaka Katsura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thermal analyzer
- Publication number 20110235671
- Publication date Sep 29, 2011
- Kentaro Yamada
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SCANNING CALORIMETER
- Publication number 20110188534
- Publication date Aug 4, 2011
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Differential scanning calorimeter
- Publication number 20100220764
- Publication date Sep 2, 2010
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Thermal analysis system and method of drying the same
- Publication number 20080025364
- Publication date Jan 31, 2008
- Rintaro Nakatani
- G01 - MEASURING TESTING
Information Patent Application
Differential scanning calorimeter
- Publication number 20070189357
- Publication date Aug 16, 2007
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Differential scanning calorimeter with a second heater
- Publication number 20050163188
- Publication date Jul 28, 2005
- Shinya Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Thermal analyzer provided with cooling mechanism
- Publication number 20050053115
- Publication date Mar 10, 2005
- Shinya Nishimura
- G01 - MEASURING TESTING

Shinya Nishimura

Person

Patents Grantslast 30 patents

Analyzing apparatus and analyzing method

Thermal analyzer

Thermoelectric conversion module and method of manufacturing the same

Thermo-gravimetric apparatus

Thermal analyzer

Imaging apparatus for thermal analyzer and thermal analyzer includi...

Thermal analyzer

Thermal analyzer

Differential scanning calorimeter

Differential scanning calorimeter

Thermal analysis system and method of drying the same

Differential scanning calorimeter

Differential scanning calorimeter with a second heater

Cooling mechanism, cooling apparatus having cooling mechanism, and...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SAMPLE CONTAINER FOR THERMAL ANALYSIS AND THERMAL ANALYZER

THERMAL ANALYZER

THERMOELECTRIC CONVERSION MODULE AND METHOD OF MANUFACTURING THE SAME

Analyzing Apparatus and Analyzing Method

METHOD FOR MANUFACTURING PHOTOVOLTAIC DEVICE

Imaging Apparatus for Thermal Analyzer and Thermal Analyzer Includi...

Thermal Analyzer

Thermal Analyzer

THERMAL ANALYZER

MANUFACTURING METHOD FOR PHOTOVOLTAIC POWER DEVICE AND MANUFACTURIN...

Thermal analyzer

DIFFERENTIAL SCANNING CALORIMETER

Differential scanning calorimeter

Thermal analysis system and method of drying the same

Differential scanning calorimeter

Differential scanning calorimeter with a second heater

Thermal analyzer provided with cooling mechanism