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Shinya Wakuda
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Beam splitter assembly and analyzer including the same
Patent number
11,435,544
Issue date
Sep 6, 2022
Shimadzu Corporation
Takeshi Maji
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrometer
Patent number
11,009,454
Issue date
May 18, 2021
Shimadzu Corporation
Shinya Wakuda
G01 - MEASURING TESTING
Information
Patent Grant
Infrared spectrophotometer
Patent number
10,890,483
Issue date
Jan 12, 2021
Shimadzu Corporation
Shinya Wakuda
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
10,670,518
Issue date
Jun 2, 2020
Shimadzu Corporation
Daijiro Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FOURIER TRANSFORM INFRARED SPECTROPHOTOMETER
Publication number
20240385105
Publication date
Nov 21, 2024
Shimadzu Corporation
Takahisa ARAKI
G01 - MEASURING TESTING
Information
Patent Application
Infrared Transmissive Member and Fourier Transform Infrared Spectro...
Publication number
20230126097
Publication date
Apr 27, 2023
Shimadzu Corporation
Shinya WAKUDA
G02 - OPTICS
Information
Patent Application
INFRARED SPECTROPHOTOMETER
Publication number
20200300698
Publication date
Sep 24, 2020
Shimadzu Corporation
Shinya WAKUDA
G01 - MEASURING TESTING
Information
Patent Application
Beam Splitter Assembly and Analyzer Including the Same
Publication number
20200249413
Publication date
Aug 6, 2020
Shimadzu Corporation
Takeshi MAJI
G01 - MEASURING TESTING
Information
Patent Application
FOURIER TRANSFORM INFRARED SPECTROMETER
Publication number
20200217786
Publication date
Jul 9, 2020
Shimadzu Corporation
Shinya WAKUDA
G01 - MEASURING TESTING
Information
Patent Application
FOURIER TRANSFORM INFRARED SPECTROPHOTOMETER
Publication number
20190011357
Publication date
Jan 10, 2019
Shimadzu Corporation
Daijiro Kato
G01 - MEASURING TESTING