Shiro Takeno

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Composition analysis method and composition analysis system
- Patent number 10,422,758
- Issue date Sep 24, 2019
- TOSHIBA MEMORY CORPORATION
- Shiro Takeno
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining lattice constant, method of evaluating materi...
- Patent number 6,844,551
- Issue date Jan 18, 2005
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydrogen-absorbing alloy, electrode and secondary battery
- Patent number 6,214,492
- Issue date Apr 10, 2001
- Kabushiki Kaisha Toshiba
- Tatsuoki Kono
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method for detecting defects in dielectric film
- Patent number 6,118,280
- Issue date Sep 12, 2000
- Kabushiki Kaisha Toshiba
- Hideki Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing polycrystal semiconductor film
- Patent number 5,970,368
- Issue date Oct 19, 1999
- Kabushiki Kaisha Toshiba
- Hideyuki Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam lithography system and method for drawing nanometer-o...
- Patent number 5,767,521
- Issue date Jun 16, 1998
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITION ANALYSIS METHOD AND COMPOSITION ANALYSIS SYSTEM
- Publication number 20180080886
- Publication date Mar 22, 2018
- Kabushiki Kaisha Toshiba
- Shiro TAKENO
- G01 - MEASURING TESTING
Information Patent Application
Method of determining lattice constant, method of evaluating materi...
- Publication number 20040094714
- Publication date May 20, 2004
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- H01 - BASIC ELECTRIC ELEMENTS