Shishir Suman

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Bihar, IN

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Patents Grantslast 30 patents

Information Patent Grant
Broad band plasma inspection based on a nuisance map
- Patent number 11,295,432
- Issue date Apr 5, 2022
- KLA-Tencor Corporation
- Kaushik Reddy Vemareddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 11,067,516
- Issue date Jul 20, 2021
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic care areas for defect detection
- Patent number 10,600,175
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 10,365,232
- Issue date Jul 30, 2019
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS
- Publication number 20200072763
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Application
BROAD BAND PLASMA INSPECTION BASED ON A NUISANCE MAP
- Publication number 20190005638
- Publication date Jan 3, 2019
- KLA-Tencor Corporation
- Kaushik Reddy Vemareddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS
- Publication number 20180328860
- Publication date Nov 15, 2018
- KLA-Tencor Corporation
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Care Areas for Defect Detection
- Publication number 20180276808
- Publication date Sep 27, 2018
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING