Shiu-Ko JANGJIAN

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 12,119,267
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chen-Cheng Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained gate semiconductor device having an interlayer dielectric...
- Patent number 12,100,767
- Issue date Sep 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of fin-like field effect transistor
- Patent number 12,087,643
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shiu-Ko Jangjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with barrier layer
- Patent number 12,046,662
- Issue date Jul 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having planar transistor and FinFET
- Patent number 12,009,262
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Barn Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFet) device structure and method fo...
- Patent number 11,949,014
- Issue date Apr 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Barn Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch stop layer in integrated circuits
- Patent number 11,942,419
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shiu-Ko JangJian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive contact having barrier layers with different depths
- Patent number 11,929,328
- Issue date Mar 12, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with barrier layer
- Patent number 11,784,240
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with barrier layer
- Patent number 11,670,704
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling electrochemical deposition to avoid defects...
- Patent number 11,603,602
- Issue date Mar 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jun-Nan Nian
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Electrochemical plating system and method of using
- Patent number 11,598,016
- Issue date Mar 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jun-Nan Nian
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,551,979
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chen-Cheng Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor device
- Patent number 11,522,001
- Issue date Dec 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shiu-Ko Jangjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch stop layer in integrated circuits
- Patent number 11,404,368
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shiu-Ko JangJian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of fin-like field effect transistor
- Patent number 11,393,727
- Issue date Jul 19, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko Jangjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having planar transistor and FinFET
- Patent number 11,328,958
- Issue date May 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Barn Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET gate structure
- Patent number 11,329,160
- Issue date May 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (finFET) device structure and method fo...
- Patent number 11,309,423
- Issue date Apr 19, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Barn Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing process thereof
- Patent number 11,271,103
- Issue date Mar 8, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Pohan Kung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having source/drain with a protrusion
- Patent number 11,270,888
- Issue date Mar 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained gate semiconductor device with oxygen-doped interlayer die...
- Patent number 11,271,114
- Issue date Mar 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective growth for high-aspect ratio metal fill
- Patent number 11,257,953
- Issue date Feb 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Nan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrochemical plating system and method of using
- Patent number 11,230,784
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jun-Nan Nian
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Mechanisms for forming image sensor device
- Patent number 11,227,886
- Issue date Jan 18, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Volume Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Support structure for integrated circuitry
- Patent number 11,177,306
- Issue date Nov 16, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Volume Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with barrier layer and method for fo...
- Patent number 11,031,488
- Issue date Jun 8, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yang Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling electrochemical deposition to avoid defects...
- Patent number 11,015,260
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jun-Nan Nian
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Flat STI surface for gate oxide uniformity in Fin FET devices
- Patent number 11,011,641
- Issue date May 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with contamination improvement
- Patent number 11,004,973
- Issue date May 11, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Chung-Ren Sun
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONDUCTIVE CONTACT HAVING BARRIER LAYERS WITH DIFFERENT DEPTHS
- Publication number 20240379557
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR
- Publication number 20240363439
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET
- Publication number 20240297079
- Publication date Sep 5, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Barn CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE CONTACT HAVING BARRIER LAYERS WITH DIFFERENT DEPTHS
- Publication number 20240079332
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER
- Publication number 20230268425
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR
- Publication number 20230253262
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20230154799
- Publication date May 18, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chen-Cheng CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR DEVICE
- Publication number 20230108974
- Publication date Apr 6, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR
- Publication number 20220352033
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etch Stop Layer in Integrated Circuits
- Publication number 20220336348
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JangJian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER
- Publication number 20220302283
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET
- Publication number 20220262680
- Publication date Aug 18, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Barn CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE AND METHOD FO...
- Publication number 20220238716
- Publication date Jul 28, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Barn CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED GATE SEMICONDUCTOR DEVICE WITH DOPED INTERLAYER DIELECTRIC...
- Publication number 20220165882
- Publication date May 26, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Ta WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROCHEMICAL PLATING SYSTEM AND METHOD OF USING
- Publication number 20220042197
- Publication date Feb 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jun-Nan Nian
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER
- Publication number 20210296472
- Publication date Sep 23, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLAT STI SURFACE FOR GATE OXIDE UNIFORMITY IN FIN FET DEVICES
- Publication number 20210273106
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Ta WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING ELECTROCHEMICAL DEPOSITION TO AVOID DEFECTS...
- Publication number 20210238765
- Publication date Aug 5, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jun-Nan NIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive Contact Having Staircase-Like Barrier Layers
- Publication number 20210125935
- Publication date Apr 29, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210083048
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Ming LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20210043518
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chen-Cheng CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR DEVICE
- Publication number 20210043670
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET
- Publication number 20210043517
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Barn CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MECHANISMS FOR FORMING IMAGE SENSOR DEVICE
- Publication number 20210013255
- Publication date Jan 14, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Volume CHIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING PROCESS THEREOF
- Publication number 20210005743
- Publication date Jan 7, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- POHAN KUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etch Stop Layer in Integrated Circuits
- Publication number 20200350244
- Publication date Nov 5, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JangJian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED GATE SEMICONDUCTOR DEVICE WITH DOPED INTERLAYER DIELECTRIC...
- Publication number 20200295193
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Ta WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING SOURCE/DRAIN WITH A PROTRUSION
- Publication number 20200266069
- Publication date Aug 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR
- Publication number 20200266110
- Publication date Aug 20, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiu-Ko JANGJIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECTION STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20200251383
- Publication date Aug 6, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Chung-Wen Wu
- H01 - BASIC ELECTRIC ELEMENTS

Shiu-Ko JANGJIAN

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor structure

Strained gate semiconductor device having an interlayer dielectric...

Structure and formation method of fin-like field effect transistor

Semiconductor device structure with barrier layer

Semiconductor device having planar transistor and FinFET

Fin field effect transistor (FinFet) device structure and method fo...

Etch stop layer in integrated circuits

Conductive contact having barrier layers with different depths

Semiconductor device structure with barrier layer

Semiconductor device structure with barrier layer

Method for controlling electrochemical deposition to avoid defects...

Electrochemical plating system and method of using

Method for manufacturing semiconductor structure

Image sensor device

Etch stop layer in integrated circuits

Structure and formation method of fin-like field effect transistor

Semiconductor device having planar transistor and FinFET

FinFET gate structure

Fin field effect transistor (finFET) device structure and method fo...

Semiconductor device and manufacturing process thereof

Semiconductor device having source/drain with a protrusion

Strained gate semiconductor device with oxygen-doped interlayer die...

Selective growth for high-aspect ratio metal fill

Electrochemical plating system and method of using

Mechanisms for forming image sensor device

Support structure for integrated circuitry

Semiconductor device structure with barrier layer and method for fo...

Method for controlling electrochemical deposition to avoid defects...

Flat STI surface for gate oxide uniformity in Fin FET devices

Semiconductor device with contamination improvement

Patents Applicationslast 30 patents

CONDUCTIVE CONTACT HAVING BARRIER LAYERS WITH DIFFERENT DEPTHS

STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR

SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET

CONDUCTIVE CONTACT HAVING BARRIER LAYERS WITH DIFFERENT DEPTHS

SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER

STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

IMAGE SENSOR DEVICE

STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR

Etch Stop Layer in Integrated Circuits

SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER

SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET

FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE AND METHOD FO...

STRAINED GATE SEMICONDUCTOR DEVICE WITH DOPED INTERLAYER DIELECTRIC...

ELECTROCHEMICAL PLATING SYSTEM AND METHOD OF USING

SEMICONDUCTOR DEVICE STRUCTURE WITH BARRIER LAYER

FLAT STI SURFACE FOR GATE OXIDE UNIFORMITY IN FIN FET DEVICES

METHOD FOR CONTROLLING ELECTROCHEMICAL DEPOSITION TO AVOID DEFECTS...

Conductive Contact Having Staircase-Like Barrier Layers

SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

IMAGE SENSOR DEVICE

SEMICONDUCTOR DEVICE HAVING PLANAR TRANSISTOR AND FINFET

MECHANISMS FOR FORMING IMAGE SENSOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING PROCESS THEREOF

Etch Stop Layer in Integrated Circuits

STRAINED GATE SEMICONDUCTOR DEVICE WITH DOPED INTERLAYER DIELECTRIC...

SEMICONDUCTOR DEVICE HAVING SOURCE/DRAIN WITH A PROTRUSION

STRUCTURE AND FORMATION METHOD OF FIN-LIKE FIELD EFFECT TRANSISTOR

INTERCONNECTION STRUCTURE AND MANUFACTURING METHOD THEREOF