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Shivananda S. Shetty
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for storing and retrieving semiconductor tester i...
Patent number
8,725,748
Issue date
May 13, 2014
Advanced Micro Devices, Inc.
Srikanth Sundararajan
G01 - MEASURING TESTING
Information
Patent Grant
Efficient storage of fail data to aid in fault isolation
Patent number
7,634,127
Issue date
Dec 15, 2009
Advanced Micro Devices, Inc.
Srikanth Sundararajan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for correlating semiconductor process data wit...
Patent number
7,263,451
Issue date
Aug 28, 2007
Advanced Micro Devices, Inc.
Jeffrey P. Erhardt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for using clustering method to analyze semicon...
Patent number
7,197,435
Issue date
Mar 27, 2007
Advanced Micro Devices, Inc.
Jeffrey P. Erhardt
G01 - MEASURING TESTING
Information
Patent Grant
Digital signal processing for real time classification of failure b...
Patent number
7,155,652
Issue date
Dec 26, 2006
Advanced Micro Devices, Inc.
Shivananda S. Shetty
G11 - INFORMATION STORAGE
Information
Patent Grant
Wafer level global bitmap characterization in integrated circuit te...
Patent number
7,137,085
Issue date
Nov 14, 2006
Advanced Micro Devices, Inc.
John J. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing distribution signatures in integrated circuit techno...
Patent number
7,099,789
Issue date
Aug 29, 2006
Advanced Micro Devices, Inc.
Franklyn Shihyu Wu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for using emission microscopy in physical verific...
Patent number
6,941,529
Issue date
Sep 6, 2005
Advanced Micro Devices, Inc.
Shivananda Shetty
G01 - MEASURING TESTING
Information
Patent Grant
System and method for processing tester information and visualizati...
Patent number
6,907,379
Issue date
Jun 14, 2005
Advanced Micro Devices, Inc.
Franklyn Shihyu Wu
G01 - MEASURING TESTING
Information
Patent Grant
Testing multiple levels in integrated circuit technology development
Patent number
6,875,560
Issue date
Apr 5, 2005
Advanced Micro Devices, Inc.
Paul J. Steffan
G01 - MEASURING TESTING
Information
Patent Grant
Determination of nonphotolithographic wafer process-splits in integ...
Patent number
6,864,107
Issue date
Mar 8, 2005
Advanced Micro Devices, Inc.
Jeffrey P. Erhardt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of simultaneous display of die and wafer characterization in...
Patent number
6,815,233
Issue date
Nov 9, 2004
Advanced Micro Devices, Inc.
Jeffrey P. Erhardt
G01 - MEASURING TESTING
Information
Patent Grant
Processing tester information by trellising in integrated circuit t...
Patent number
6,766,265
Issue date
Jul 20, 2004
Advanced Micro Devices, Inc.
Shivananda S. Shetty
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
PROCESSING TESTER INFORMATION BY TRELLISING IN INTEGRATED CIRCUIT T...
Publication number
20040122601
Publication date
Jun 24, 2004
Shivananda S. Shetty
G06 - COMPUTING CALCULATING COUNTING