Shlomit Katz

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Beit Hanania, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for error reduction for metrology measurements
- Patent number 11,353,799
- Issue date Jun 7, 2022
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data-driven misregistration parameter configuration and measurement...
- Patent number 11,353,493
- Issue date Jun 7, 2022
- KLA-Tencor Corporation
- Shlomit Katz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Error Reduction for Metrology Measurements
- Publication number 20220155693
- Publication date May 19, 2022
- KLA Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA-DRIVEN MISREGISTRATION PARAMETER CONFIGURATION AND MEASUREMENT...
- Publication number 20210011073
- Publication date Jan 14, 2021
- KLA-Tencor Corporation
- Shlomit Katz
- G05 - CONTROLLING REGULATING