Shlomo Eisenbach

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3D PROFILOMETRY WITH A LINNIK INTERFEROMETER
- Publication number 20240035810
- Publication date Feb 1, 2024
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY UTILIZING SHORT-WAVE INFRARED WAVELENGTHS
- Publication number 20220291143
- Publication date Sep 15, 2022
- Amnon Manassen
- G01 - MEASURING TESTING