Sho Takami

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 8,686,380
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming method and charged particle beam apparatus
- Patent number 8,203,504
- Issue date Jun 19, 2012
- Hitachi High-Technologies Corporation
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming method and charged particle beam apparatus
- Patent number 7,817,105
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring method and electron microscope
- Patent number 7,795,581
- Issue date Sep 14, 2010
- Hitachi High-Technologies Corporation
- Shuichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,566,892
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,435,958
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,205,550
- Issue date Apr 17, 2007
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming method and charged particle beam apparatus
- Patent number 7,187,345
- Issue date Mar 6, 2007
- Hitachi High-Technologies Corporation
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopic inspection apparatus
- Patent number 7,091,496
- Issue date Aug 15, 2006
- Hitachi High-Technologies Corporation
- Sho Takami
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,030,376
- Issue date Apr 18, 2006
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,512,228
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,444,981
- Issue date Sep 3, 2002
- Hitachi, Ltd.
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,912,462
- Issue date Jun 15, 1999
- Hitachi, Ltd.
- Sho Takami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20110032176
- Publication date Feb 10, 2011
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20090294697
- Publication date Dec 3, 2009
- Hitachi High-Technologies Corporation
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measuring Method and Electron Microscope
- Publication number 20080210865
- Publication date Sep 4, 2008
- Hitachi High-Technologies Corporation
- Shuichi NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus and Method for Production of Its Specimen C...
- Publication number 20080048118
- Publication date Feb 28, 2008
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image forming method and charged particle beam apparatus
- Publication number 20070159662
- Publication date Jul 12, 2007
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20070024528
- Publication date Feb 1, 2007
- Atsushi Kobaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20060232445
- Publication date Oct 19, 2006
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20060219946
- Publication date Oct 5, 2006
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20040135082
- Publication date Jul 15, 2004
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscopic inspection apparatus
- Publication number 20040036489
- Publication date Feb 26, 2004
- Sho Takami
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20020148960
- Publication date Oct 17, 2002
- Hitachi, Ltd
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Charged particle beam apparatus

Image forming method and charged particle beam apparatus

Image forming method and charged particle beam apparatus

Pattern measuring method and electron microscope

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Image forming method and charged particle beam apparatus

Electron microscopic inspection apparatus

Electron beam apparatus and method for production of its specimen c...

Scanning electron microscope

Scanning electron microscope

Electron microscope

Patents Applicationslast 30 patents

IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Charged particle beam apparatus

Pattern Measuring Method and Electron Microscope

Electron Beam Apparatus and Method for Production of Its Specimen C...

Image forming method and charged particle beam apparatus

IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron microscopic inspection apparatus

Scanning electron microscope