Shoaib Zaidi

Person

People

Patents Grantslast 30 patents

Information Patent Grant
Low power phase change memory cell with large read signal
- Patent number 7,973,301
- Issue date Jul 5, 2011
- Qimonda AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Energy adjusted write pulses in phase-change memory cells
- Patent number 7,859,894
- Issue date Dec 28, 2010
- Qimonda AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating an integrated circuit having a memory includi...
- Patent number 7,824,951
- Issue date Nov 2, 2010
- Qimonda AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device
- Patent number 7,718,467
- Issue date May 18, 2010
- Qimonda AG
- Shoaib Hasan Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Targets for measurements in semiconductor devices
- Patent number 7,427,774
- Issue date Sep 23, 2008
- Infineon Technologies AG
- Ulrich Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 7,408,240
- Issue date Aug 5, 2008
- Infineon Technologies AG
- Shoaib Hasan Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical determination of resistivity of phase change materials
- Patent number 7,388,667
- Issue date Jun 17, 2008
- Infineon Technologies AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having a memory including a low-k dielectric mat...
- Patent number 7,361,925
- Issue date Apr 22, 2008
- Infineon Technologies AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Energy adjusted write pulses in phase-change memories
- Patent number 7,327,623
- Issue date Feb 5, 2008
- Infineon Technologies AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
Energy adjusted write pulses in phase-change memories
- Patent number 7,113,424
- Issue date Sep 26, 2006
- Infineon Technologies AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for quantifying errors in an alternating phase sh...
- Patent number 7,016,027
- Issue date Mar 21, 2006
- Infineon Technologies AG
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Grant
System and method of enhancing alignment marks
- Patent number 6,954,002
- Issue date Oct 11, 2005
- Infineon Technologies North America Corp.
- Shoaib H. Zaidi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment or overlay marks for semiconductor processing
- Patent number 6,888,260
- Issue date May 3, 2005
- Infineon Technologies Aktiengesellschaft
- Enio Carpi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for overlay metrology of low contrast features
- Patent number 6,724,479
- Issue date Apr 20, 2004
- Infineon Technologies AG
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the rate of etching of a semiconductor
- Patent number 6,687,014
- Issue date Feb 3, 2004
- Infineon Technologies AG
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Grant
Method for enabling access to micro-sections of integrated circuits...
- Patent number 6,548,314
- Issue date Apr 15, 2003
- Infineon Technologies AG
- Shoaib Hasan Zaidi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH OPTICAL SWITCH
- Publication number 20080285912
- Publication date Nov 20, 2008
- QIMONDA NORTH AMERICA CORP.
- Shoaib Zaidi
- G02 - OPTICS
Information Patent Application
METHOD OF FABRICATING AN INTEGRATED CIRCUIT HAVING A MEMORY INCLUDI...
- Publication number 20080158943
- Publication date Jul 3, 2008
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE
- Publication number 20080157072
- Publication date Jul 3, 2008
- INFINEON TECHNOLOGIES AG
- Shoaib Hasan Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY ADJUSTED WRITE PULSES IN PHASE-CHANGE MEMORY CELLS
- Publication number 20080106928
- Publication date May 8, 2008
- Thomas Happ
- G01 - MEASURING TESTING
Information Patent Application
Memory cell having active region sized for low reset current and me...
- Publication number 20080012079
- Publication date Jan 17, 2008
- Shoaib Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory device
- Publication number 20070267618
- Publication date Nov 22, 2007
- Shoaib Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase change memory
- Publication number 20070249086
- Publication date Oct 25, 2007
- Jan Boris Philipp
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor wafer having measurement area feature for determining...
- Publication number 20070178611
- Publication date Aug 2, 2007
- Shoaib Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask-less method of forming aligned semiconductor wafer features
- Publication number 20070092810
- Publication date Apr 26, 2007
- Shoaib Zaidi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical determination of resistivity of phase change materials
- Publication number 20070076191
- Publication date Apr 5, 2007
- Thomas Happ
- G01 - MEASURING TESTING
Information Patent Application
Energy adjusted write pulses in phase-change memories
- Publication number 20070014173
- Publication date Jan 18, 2007
- Infineon Technologies AG
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Application
Low power phase change memory cell with large read signal
- Publication number 20060261321
- Publication date Nov 23, 2006
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Application
Memory device
- Publication number 20060245236
- Publication date Nov 2, 2006
- Shoaib Hasan Zaidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase change memory cell with high read margin at low power operation
- Publication number 20060175596
- Publication date Aug 10, 2006
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Application
Energy adjusted write pulses in phase-change memories
- Publication number 20060109707
- Publication date May 25, 2006
- Infineon Technologies North America Corp.
- Thomas Happ
- G11 - INFORMATION STORAGE
Information Patent Application
Optical system and method for measuring small dimensions
- Publication number 20060077403
- Publication date Apr 13, 2006
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Application
System and method for quantifying errors in an alternating phase sh...
- Publication number 20040223145
- Publication date Nov 11, 2004
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT OR OVERLAY MARKS FOR SEMICONDUCTOR PROCESSING
- Publication number 20040207097
- Publication date Oct 21, 2004
- Enio Carpi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of enhancing alignment marks
- Publication number 20040041283
- Publication date Mar 4, 2004
- Infineon Technologies North America Corp.
- Shoaib H. Zaidi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for monitoring the rate of etching of a semiconductor
- Publication number 20030133127
- Publication date Jul 17, 2003
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Application
Method for overlay metrology of low contrast features
- Publication number 20030063278
- Publication date Apr 3, 2003
- Shoaib Hasan Zaidi
- G01 - MEASURING TESTING

Shoaib Zaidi

Person

Patents Grantslast 30 patents

Low power phase change memory cell with large read signal

Energy adjusted write pulses in phase-change memory cells

Method of fabricating an integrated circuit having a memory includi...

Memory device

Targets for measurements in semiconductor devices

Memory device

Optical determination of resistivity of phase change materials

Integrated circuit having a memory including a low-k dielectric mat...

Energy adjusted write pulses in phase-change memories

Energy adjusted write pulses in phase-change memories

System and method for quantifying errors in an alternating phase sh...

System and method of enhancing alignment marks

Alignment or overlay marks for semiconductor processing

Method for overlay metrology of low contrast features

Method for monitoring the rate of etching of a semiconductor

Method for enabling access to micro-sections of integrated circuits...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT WITH OPTICAL SWITCH

METHOD OF FABRICATING AN INTEGRATED CIRCUIT HAVING A MEMORY INCLUDI...

MEMORY DEVICE

ENERGY ADJUSTED WRITE PULSES IN PHASE-CHANGE MEMORY CELLS

Memory cell having active region sized for low reset current and me...

Memory device

Phase change memory

Semiconductor wafer having measurement area feature for determining...

Mask-less method of forming aligned semiconductor wafer features

Optical determination of resistivity of phase change materials

Energy adjusted write pulses in phase-change memories

Low power phase change memory cell with large read signal

Memory device

Phase change memory cell with high read margin at low power operation

Energy adjusted write pulses in phase-change memories

Optical system and method for measuring small dimensions

System and method for quantifying errors in an alternating phase sh...

ALIGNMENT OR OVERLAY MARKS FOR SEMICONDUCTOR PROCESSING

System and method of enhancing alignment marks

Method for monitoring the rate of etching of a semiconductor

Method for overlay metrology of low contrast features