Shohei Morishima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit with self testing and method of te...
- Patent number 11,280,831
- Issue date Mar 22, 2022
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SEMICONDUCTO...
- Publication number 20210063484
- Publication date Mar 4, 2021
- Kabushiki Kaisha Toshiba
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, FAILURE DIAGNOSIS SYSTEM AND FAIL...
- Publication number 20120229155
- Publication date Sep 13, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE