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Shohei TERADA
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
DNA transport control device and method for producing same, as well...
Patent number
10,253,362
Issue date
Apr 9, 2019
Hitachi High-Technologies Corporation
Hiroshi Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder for electron microscope
Patent number
9,558,910
Issue date
Jan 31, 2017
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Specimen holder for charged-particle beam apparatus
Patent number
9,024,275
Issue date
May 5, 2015
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope apparatus comprising electron spec...
Patent number
8,530,858
Issue date
Sep 10, 2013
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope having electron spectrometer
Patent number
8,436,301
Issue date
May 7, 2013
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample transfer device and sample transferring method
Patent number
8,410,457
Issue date
Apr 2, 2013
Hitachi, Ltd.
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope with electron spectrometer
Patent number
8,344,320
Issue date
Jan 1, 2013
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample holder for electron microscope
Patent number
8,338,798
Issue date
Dec 25, 2012
Hitachi, Ltd.
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope having electron spectroscope
Patent number
8,263,936
Issue date
Sep 11, 2012
Hitachi High-Technologies Corporation
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for observing inside structures, and specimen...
Patent number
8,134,131
Issue date
Mar 13, 2012
Hitachi, Ltd.
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Grant
Electron microscope with electron spectrometer
Patent number
7,888,641
Issue date
Feb 15, 2011
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope provided with electronic spectroscope
Patent number
7,723,682
Issue date
May 25, 2010
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for evaluating thin films
Patent number
7,544,935
Issue date
Jun 9, 2009
Hitachi, Ltd.
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for observing inside structures, and specimen...
Patent number
7,476,872
Issue date
Jan 13, 2009
Hitachi Ltd.
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for observing inside structures, and specimen...
Patent number
7,462,830
Issue date
Dec 9, 2008
Hitachi Ltd.
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Grant
Standard sample for transmission electron microscope (TEM) elementa...
Patent number
7,053,372
Issue date
May 30, 2006
Samsung Electronics Co., Ltd.
Gyeong-su Park
G01 - MEASURING TESTING
Information
Patent Grant
Electron microscope
Patent number
6,933,500
Issue date
Aug 23, 2005
Hitachi, Ltd.
Kazutoshi Kaji
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOFT MAGNETIC IRON ALLOY PLATE, IRON CORE USING THE SOFT MAGNETIC I...
Publication number
20250037911
Publication date
Jan 30, 2025
Hitachi, Ltd
Tomohiro TABATA
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Application
SOFT MAGNETIC IRON ALLOY SHEET AND METHOD OF MANUFACTURING THE SAME
Publication number
20240233993
Publication date
Jul 11, 2024
Hitachi, Ltd
Tomohiro TABATA
C21 - METALLURGY OF IRON
Information
Patent Application
Soft Magnetic Iron Alloy Plate, Method for Manufacturing Soft Magne...
Publication number
20240194383
Publication date
Jun 13, 2024
Hitachi, Ltd
Matahiro KOMURO
C21 - METALLURGY OF IRON
Information
Patent Application
Magnetic Material, Iron Core, and Rotating Electric Machine
Publication number
20240186841
Publication date
Jun 6, 2024
Hitachi, Ltd
Yusuke ASARI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOFT MAGNETIC IRON ALLOY SHEET AND METHOD OF MANUFACTURING THE SAME
Publication number
20240136096
Publication date
Apr 25, 2024
Hitachi, Ltd
Tomohiro TABATA
C21 - METALLURGY OF IRON
Information
Patent Application
Soft Magnetic Iron Sheet, Method for Producing Soft Magnetic Iron S...
Publication number
20230290551
Publication date
Sep 14, 2023
Hitachi, Ltd
Matahiro KOMURO
C21 - METALLURGY OF IRON
Information
Patent Application
Soft Magnetic Material, Method for Producing Soft Magnetic Material...
Publication number
20230287546
Publication date
Sep 14, 2023
Hitachi, Ltd
Kazuya SHINAGAWA
B22 - CASTING POWDER METALLURGY
Information
Patent Application
SOFT MAGNETIC STEEL SHEET, METHOD FOR MANUFACTURING THE SOFT MAGNET...
Publication number
20220328225
Publication date
Oct 13, 2022
Hitachi, Ltd
Matahiro KOMURO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
DNA Transport Control Device and Method for Producing Same, as Well...
Publication number
20160244823
Publication date
Aug 25, 2016
Hitachi High-Technologies Corporation
Hiroshi YOSHIDA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
Publication number
20140353499
Publication date
Dec 4, 2014
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Specimen Holder for Charged-Particle Beam Apparatus
Publication number
20130140458
Publication date
Jun 6, 2013
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER
Publication number
20110240854
Publication date
Oct 6, 2011
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE TRANSFER DEVICE AND SAMPLE TRANSFERRING METHOD
Publication number
20110180724
Publication date
Jul 28, 2011
Hitachi, Ltd.
Shohei TERADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSMISSION ELECTRON MICROSCOPE APPARATUS COMPRISING ELECTRON SPEC...
Publication number
20110155906
Publication date
Jun 30, 2011
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
Publication number
20110095182
Publication date
Apr 28, 2011
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
Publication number
20100320396
Publication date
Dec 23, 2010
Hitachi, Ltd.
Shohei TERADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Observing Inside Structures, and Specimen...
Publication number
20090302234
Publication date
Dec 10, 2009
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROSCOPE
Publication number
20090242766
Publication date
Oct 1, 2009
Hitachi High-Technologies Corporation
Shohei TERADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
Publication number
20090045340
Publication date
Feb 19, 2009
Shohei TERADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscope Provided with Electronic Spectroscope
Publication number
20080203296
Publication date
Aug 28, 2008
Hitachi High-Technologies Corporation
Shohei TERADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN...
Publication number
20070252091
Publication date
Nov 1, 2007
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for evaluating thin films
Publication number
20060145075
Publication date
Jul 6, 2006
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Application
Standard sample for transmission electron microscope (TEM) elementa...
Publication number
20050184233
Publication date
Aug 25, 2005
Samsung Electronics Co., Ltd.
Gyeong-su Park
G01 - MEASURING TESTING
Information
Patent Application
Electron microscope
Publication number
20050167589
Publication date
Aug 4, 2005
Hitachi, Ltd.
Kazutoshi Kaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron microscope
Publication number
20050127295
Publication date
Jun 16, 2005
Hitachi, Ltd.
Kazutoshi Kaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for observing inside structures, and specimen...
Publication number
20050061971
Publication date
Mar 24, 2005
Shohei Terada
G01 - MEASURING TESTING
Information
Patent Application
Electron microscope
Publication number
20040094712
Publication date
May 20, 2004
Hitachi, Ltd.
Kazutoshi Kaji
H01 - BASIC ELECTRIC ELEMENTS