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Shoichi NAKANISHI
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Tokyo, JP
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last 30 patents
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Patent Grant
Image acquisition device, image acquisition method, and image corre...
Patent number
10,520,453
Issue date
Dec 31, 2019
TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Akira Monkawa
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for image reconstruction at different X-ray energ...
Patent number
10,521,936
Issue date
Dec 31, 2019
TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Akira Monkawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for image reconstruction at different X-ray energ...
Patent number
9,928,619
Issue date
Mar 27, 2018
TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Akira Monkawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
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Patent Application
IMAGE ACQUISITION DEVICE, IMAGE ACQUISITION METHOD, AND IMAGE CORRE...
Publication number
20180172606
Publication date
Jun 21, 2018
Tokyo Metropolitan Industrial Technology Research Institute
Akira MONKAWA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR IMAGE RECONSTRUCTION AT DIFFERENT X-RAY ENERG...
Publication number
20170365077
Publication date
Dec 21, 2017
Tokyo Metropolitan Industrial Technology Research Institute
Akira MONKAWA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR IMAGE RECONSTRUCTION AT DIFFERENT X-RAY ENERG...
Publication number
20160133032
Publication date
May 12, 2016
Tokyo Metropolitan Industrial Technology Research Institute
Akira MONKAWA
G01 - MEASURING TESTING