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Shoji Horiuchi
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Chofu, JP
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last 30 patents
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Patent Grant
Method and apparatus for measuring the size of a single fine partic...
Patent number
5,229,839
Issue date
Jul 20, 1993
National Aerospace Laboratory of Science and Technology Agency
Shigeru Hayashi
G01 - MEASURING TESTING
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Patent Grant
Photoelectric conversion sensor with shifted arcuate elements
Patent number
4,882,478
Issue date
Nov 21, 1989
Hideo Nagasu and Tohnichi Computer Applications Co., Ltd.
Shigeru Hayashi
G01 - MEASURING TESTING