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Gyoda, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Wavelength determining device, wavelength meter equipped with the d...
Patent number
7,423,759
Issue date
Sep 9, 2008
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical frequency measurement apparatus and optical frequency measu...
Patent number
7,324,208
Issue date
Jan 29, 2008
Advantest Corporation
Shoji Niki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Temperature stabilizer and oscillating apparatus
Patent number
7,292,116
Issue date
Nov 6, 2007
Advantest Corporation
Shoji Niki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Photometer
Patent number
7,230,691
Issue date
Jun 12, 2007
Advantest Corporation
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Grant
Optical network analyzer
Patent number
7,079,231
Issue date
Jul 18, 2006
Advantest Corporation
Takashi Kido
G01 - MEASURING TESTING
Information
Patent Grant
Optical network analyzer
Patent number
6,980,288
Issue date
Dec 27, 2005
Advantest Corporation
Takashi Kido
G01 - MEASURING TESTING
Information
Patent Grant
Propagation measuring apparatus and a propagation measuring method
Patent number
6,873,405
Issue date
Mar 29, 2005
Advantest Corporation
Takashi Kido
G01 - MEASURING TESTING
Information
Patent Grant
Polarization state changing apparatus and polarization degree measu...
Patent number
5,633,959
Issue date
May 27, 1997
Advantest Corporation
Shoji Niki
G02 - OPTICS
Information
Patent Grant
Frequency converter for varying the frequency of a local signal ove...
Patent number
5,352,885
Issue date
Oct 4, 1994
Advantest Corporation
Shoji Niki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical pulse oscillator and light frequency measuring apparatus us...
Patent number
5,222,070
Issue date
Jun 22, 1993
Advantest Corporation
Shoji Niki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical interference signal extractor with device for reduced noise...
Patent number
5,110,211
Issue date
May 5, 1992
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring average frequencies
Patent number
4,680,540
Issue date
Jul 14, 1987
Takeda Riken Kogyo Kabushikikaisha
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Grant
Signal detector
Patent number
4,620,147
Issue date
Oct 28, 1986
Takeda Riken Co., Ltd.
Shoji Niki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Average frequency measuring apparatus
Patent number
4,468,614
Issue date
Aug 28, 1984
Takeda Riken Kogyo Kabushiki Kaisha
Toshiro Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Frequency measuring apparatus
Patent number
4,310,891
Issue date
Jan 12, 1982
Takeda Riken Kogyo Kabushiki Kaisha
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Grant
Electric field intensity measuring apparatus
Patent number
4,272,719
Issue date
Jun 9, 1981
Takeda Riken Kogyo Kabushikikaisha
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Grant
Pulse modulated wave measuring device
Patent number
4,127,809
Issue date
Nov 28, 1978
Takeda Riken Kogyo Kabushikikaisha
Shoji Niki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical frequency measurement apparatus and optical frequency measu...
Publication number
20070024855
Publication date
Feb 1, 2007
Advantest Corporation
Shoji Niki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Wavelength determining device, wavelength meter equipped with the d...
Publication number
20060221344
Publication date
Oct 5, 2006
Advantest Corporation
Shin Masuda
G01 - MEASURING TESTING
Information
Patent Application
Photometer
Publication number
20060203228
Publication date
Sep 14, 2006
Shoji Niki
G01 - MEASURING TESTING
Information
Patent Application
Temperature stabilizer and oscillating apparatus
Publication number
20060139116
Publication date
Jun 29, 2006
Advantest Corporation
Shoji Niki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Optical network analyzer
Publication number
20060062574
Publication date
Mar 23, 2006
Advantest Corporation
Takashi Kido
G01 - MEASURING TESTING
Information
Patent Application
Propagation measuring apparatus and a propagation measuring method
Publication number
20040130725
Publication date
Jul 8, 2004
Takashi Kido
G01 - MEASURING TESTING
Information
Patent Application
Optical network analyzer
Publication number
20040067056
Publication date
Apr 8, 2004
Takashi Kido
G01 - MEASURING TESTING